TY - JOUR
T1 - Design analysis of a beam splitter based on the frustrated total internal reflection
AU - Chang Chien, J. R.
AU - Liu, C. C.
AU - Wu, C. J.
AU - Wu, P. Y.
AU - Li, C. C.
PY - 2012
Y1 - 2012
N2 - In this work, a theoretical analysis on the design of the beam splitter (BS) based on the frustrated total internal reflection (FTIR) is made. We consider a model structure made of a low-index gap layer bounded by two high-index layers. In the design of a 50/50 BS, we find that there exists a critical gap thickness which is a decreasing function of the angle of incidence for both TE and TM waves. There also exists a critical wavelength for the incident wave, and it increases with increasing angle of incidence. Finally, at a fixed gap thickness and wavelength of incident wave, the critical angle in TE wave is slightly larger than that of TM wave. The analysis provides some fundamental information that is of particular use to the design of a BS within the framework of FTIR.
AB - In this work, a theoretical analysis on the design of the beam splitter (BS) based on the frustrated total internal reflection (FTIR) is made. We consider a model structure made of a low-index gap layer bounded by two high-index layers. In the design of a 50/50 BS, we find that there exists a critical gap thickness which is a decreasing function of the angle of incidence for both TE and TM waves. There also exists a critical wavelength for the incident wave, and it increases with increasing angle of incidence. Finally, at a fixed gap thickness and wavelength of incident wave, the critical angle in TE wave is slightly larger than that of TM wave. The analysis provides some fundamental information that is of particular use to the design of a BS within the framework of FTIR.
UR - http://www.scopus.com/inward/record.url?scp=84863069066&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84863069066&partnerID=8YFLogxK
U2 - 10.2528/PIER11110904
DO - 10.2528/PIER11110904
M3 - Article
AN - SCOPUS:84863069066
SN - 1070-4698
VL - 124
SP - 71
EP - 83
JO - Progress in Electromagnetics Research
JF - Progress in Electromagnetics Research
ER -