Depth-profile study of the electronic structures at Ga2O 3(Gd2O3) and Gd2O3-GaN interfaces by X-ray photoelectron spectroscopy

T. S. Lay*, Y. Y. Liao, W. H. Hung, M. Hong, J. Kwo, J. P. Mannaerts

*Corresponding author for this work

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23 Citations (Scopus)


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Engineering & Materials Science

Chemical Compounds

Physics & Astronomy