Depth-profile study of the electronic structures at Ga2O 3(Gd2O3) and Gd2O3-GaN interfaces by X-ray photoelectron spectroscopy

T. S. Lay*, Y. Y. Liao, W. H. Hung, M. Hong, J. Kwo, J. P. Mannaerts

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

23 Citations (Scopus)

Fingerprint

Dive into the research topics of 'Depth-profile study of the electronic structures at Ga<sub>2</sub>O <sub>3</sub>(Gd<sub>2</sub>O<sub>3</sub>) and Gd<sub>2</sub>O<sub>3</sub>-GaN interfaces by X-ray photoelectron spectroscopy'. Together they form a unique fingerprint.

Engineering & Materials Science

Chemical Compounds

Physics & Astronomy