Depth measurement based on pixel number variation and Speeded Up Robust Features

Chen Chien Hsu, Po Ting Huang, Zhong Han Cai, Ming Chih Lu, Yin Yu Lu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This paper presents a method for depth measurement based on Speeded Up Robust Features (SURF) and pixel number variation of CCD Images. A single camera is used to capture two images in different photographing distances, where features in the images are extracted and matched by SURF. To remove false matching points, an Identifying point correspondences by Correspondence Function (ICF) method is adopted to automatically select suitable reference points required for the pixel number variation method. Based on the displacement of the camera at two photographing distances, difference in pixel count between feature points of the objects in the images can be used to determine the photographing distance of the target objects for constructing the depth map.

Original languageEnglish
Title of host publicationProceedings 2014 IEEE 4th International Conference on Consumer Electronics - Berlin, ICCE-Berlin
EditorsFrancisco J. Bellido, Dietmar Hepper, Hans L. Cycon, Alexander Huhn
PublisherIEEE Computer Society
Pages228-229
Number of pages2
EditionFebruary
ISBN (Electronic)9781479961658
DOIs
Publication statusPublished - 2015 Feb 5
Event2014 4th IEEE International Conference on Consumer Electronics - Berlin, ICCE-Berlin - Berlin, Germany
Duration: 2014 Sep 72014 Sep 10

Publication series

NameIEEE International Conference on Consumer Electronics - Berlin, ICCE-Berlin
NumberFebruary
Volume2015-February
ISSN (Print)2166-6814
ISSN (Electronic)2166-6822

Other

Other2014 4th IEEE International Conference on Consumer Electronics - Berlin, ICCE-Berlin
CountryGermany
CityBerlin
Period14/9/714/9/10

Fingerprint

Pixels
Cameras
Charge coupled devices

Keywords

  • Distance measurement
  • SURF
  • Speeded Up Robust Features
  • depth
  • digital camera
  • image-based measuring systems
  • pixel

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Industrial and Manufacturing Engineering
  • Media Technology

Cite this

Hsu, C. C., Huang, P. T., Cai, Z. H., Lu, M. C., & Lu, Y. Y. (2015). Depth measurement based on pixel number variation and Speeded Up Robust Features. In F. J. Bellido, D. Hepper, H. L. Cycon, & A. Huhn (Eds.), Proceedings 2014 IEEE 4th International Conference on Consumer Electronics - Berlin, ICCE-Berlin (February ed., pp. 228-229). [7034300] (IEEE International Conference on Consumer Electronics - Berlin, ICCE-Berlin; Vol. 2015-February, No. February). IEEE Computer Society. https://doi.org/10.1109/ICCE-Berlin.2014.7034300

Depth measurement based on pixel number variation and Speeded Up Robust Features. / Hsu, Chen Chien; Huang, Po Ting; Cai, Zhong Han; Lu, Ming Chih; Lu, Yin Yu.

Proceedings 2014 IEEE 4th International Conference on Consumer Electronics - Berlin, ICCE-Berlin. ed. / Francisco J. Bellido; Dietmar Hepper; Hans L. Cycon; Alexander Huhn. February. ed. IEEE Computer Society, 2015. p. 228-229 7034300 (IEEE International Conference on Consumer Electronics - Berlin, ICCE-Berlin; Vol. 2015-February, No. February).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Hsu, CC, Huang, PT, Cai, ZH, Lu, MC & Lu, YY 2015, Depth measurement based on pixel number variation and Speeded Up Robust Features. in FJ Bellido, D Hepper, HL Cycon & A Huhn (eds), Proceedings 2014 IEEE 4th International Conference on Consumer Electronics - Berlin, ICCE-Berlin. February edn, 7034300, IEEE International Conference on Consumer Electronics - Berlin, ICCE-Berlin, no. February, vol. 2015-February, IEEE Computer Society, pp. 228-229, 2014 4th IEEE International Conference on Consumer Electronics - Berlin, ICCE-Berlin, Berlin, Germany, 14/9/7. https://doi.org/10.1109/ICCE-Berlin.2014.7034300
Hsu CC, Huang PT, Cai ZH, Lu MC, Lu YY. Depth measurement based on pixel number variation and Speeded Up Robust Features. In Bellido FJ, Hepper D, Cycon HL, Huhn A, editors, Proceedings 2014 IEEE 4th International Conference on Consumer Electronics - Berlin, ICCE-Berlin. February ed. IEEE Computer Society. 2015. p. 228-229. 7034300. (IEEE International Conference on Consumer Electronics - Berlin, ICCE-Berlin; February). https://doi.org/10.1109/ICCE-Berlin.2014.7034300
Hsu, Chen Chien ; Huang, Po Ting ; Cai, Zhong Han ; Lu, Ming Chih ; Lu, Yin Yu. / Depth measurement based on pixel number variation and Speeded Up Robust Features. Proceedings 2014 IEEE 4th International Conference on Consumer Electronics - Berlin, ICCE-Berlin. editor / Francisco J. Bellido ; Dietmar Hepper ; Hans L. Cycon ; Alexander Huhn. February. ed. IEEE Computer Society, 2015. pp. 228-229 (IEEE International Conference on Consumer Electronics - Berlin, ICCE-Berlin; February).
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