Defect-engineered room temperature negative differential resistance in monolayer MoS2 transistors

Wen Hao Chang, Chun I. Lu, Tilo H. Yang, Shu Ting Yang, Kristan Bryan Simbulan, Chih Pin Lin, Shang Hsien Hsieh, Jyun Hong Chen, Kai Shin Li, Chia Hao Chen, Tuo Hung Hou, Ting Hua Lu, Yann Wen Lan*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

2 Citations (Scopus)

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