Abstract
Solid state recrystallization (SSR) techniques have been successfully applied to the Hg1-xMnxTe (x=0.125) system. The resulting Hg1-xMnxTe is as homogeneous as SSR grown Hg1-xCdxTe, based on microprobe, density, IR transmission, photoluminescence, and electroreflectance measurements. Transport measurements on these SSR Hg1-xMnxTe crystals show magnetic boil-off at low temperatures, indicating that these samples are comparable in quality to Bridgman grown Hg1-xMnxTe.
| Original language | English |
|---|---|
| Pages (from-to) | 617-621 |
| Number of pages | 5 |
| Journal | Journal of Crystal Growth |
| Volume | 97 |
| Issue number | 3-4 |
| DOIs | |
| Publication status | Published - 1989 Oct |
| Externally published | Yes |
ASJC Scopus subject areas
- Condensed Matter Physics
- Inorganic Chemistry
- Materials Chemistry
Fingerprint
Dive into the research topics of 'Crystal growth of Hg1-xMnxTe by solid state recrystallization'. Together they form a unique fingerprint.Cite this
- APA
- Standard
- Harvard
- Vancouver
- Author
- BIBTEX
- RIS