Crystal growth of Hg1-xMnxTe by solid state recrystallization

R. G. Mani*, T. McNair, C. R. Lu, R. Grober

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

14 Citations (Scopus)

Abstract

Solid state recrystallization (SSR) techniques have been successfully applied to the Hg1-xMnxTe (x=0.125) system. The resulting Hg1-xMnxTe is as homogeneous as SSR grown Hg1-xCdxTe, based on microprobe, density, IR transmission, photoluminescence, and electroreflectance measurements. Transport measurements on these SSR Hg1-xMnxTe crystals show magnetic boil-off at low temperatures, indicating that these samples are comparable in quality to Bridgman grown Hg1-xMnxTe.

Original languageEnglish
Pages (from-to)617-621
Number of pages5
JournalJournal of Crystal Growth
Volume97
Issue number3-4
DOIs
Publication statusPublished - 1989 Oct
Externally publishedYes

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Inorganic Chemistry
  • Materials Chemistry

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