Crystal growth of Hg1-xMnxTe by solid state recrystallization

R. G. Mani; T. McNair; C. R. Lu; R. Grober

doi:10.1016/0022-0248(89)90563-0

Crystal growth of Hg_1-xMn_xTe by solid state recrystallization

R. G. Mani, T. McNair, C. R. Lu, R. Grober

Department of Physics

Research output: Contribution to journal › Article

13 Citations (Scopus)

Abstract

Solid state recrystallization (SSR) techniques have been successfully applied to the Hg_1-xMn_xTe (x=0.125) system. The resulting Hg_1-xMn_xTe is as homogeneous as SSR grown Hg_1-xCd_xTe, based on microprobe, density, IR transmission, photoluminescence, and electroreflectance measurements. Transport measurements on these SSR Hg_1-xMn_xTe crystals show magnetic boil-off at low temperatures, indicating that these samples are comparable in quality to Bridgman grown Hg_1-xMn_xTe.

Original language	English
Pages (from-to)	617-621
Number of pages	5
Journal	Journal of Crystal Growth
Volume	97
Issue number	3-4
DOIs	https://doi.org/10.1016/0022-0248(89)90563-0
Publication status	Published - 1989 Oct

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ASJC Scopus subject areas

Condensed Matter Physics
Inorganic Chemistry
Materials Chemistry

Cite this

Mani, R. G., McNair, T., Lu, C. R., & Grober, R. (1989). Crystal growth of Hg_1-xMn_xTe by solid state recrystallization. Journal of Crystal Growth, 97(3-4), 617-621. https://doi.org/10.1016/0022-0248(89)90563-0

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AB - Solid state recrystallization (SSR) techniques have been successfully applied to the Hg1-xMnxTe (x=0.125) system. The resulting Hg1-xMnxTe is as homogeneous as SSR grown Hg1-xCdxTe, based on microprobe, density, IR transmission, photoluminescence, and electroreflectance measurements. Transport measurements on these SSR Hg1-xMnxTe crystals show magnetic boil-off at low temperatures, indicating that these samples are comparable in quality to Bridgman grown Hg1-xMnxTe.

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10.1016/0022-0248(89)90563-0