Abstract
Solid state recrystallization (SSR) techniques have been successfully applied to the Hg1-xMnxTe (x=0.125) system. The resulting Hg1-xMnxTe is as homogeneous as SSR grown Hg1-xCdxTe, based on microprobe, density, IR transmission, photoluminescence, and electroreflectance measurements. Transport measurements on these SSR Hg1-xMnxTe crystals show magnetic boil-off at low temperatures, indicating that these samples are comparable in quality to Bridgman grown Hg1-xMnxTe.
Original language | English |
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Pages (from-to) | 617-621 |
Number of pages | 5 |
Journal | Journal of Crystal Growth |
Volume | 97 |
Issue number | 3-4 |
DOIs | |
Publication status | Published - 1989 Oct |
ASJC Scopus subject areas
- Condensed Matter Physics
- Inorganic Chemistry
- Materials Chemistry