Conductivity and dielectric relaxation phenomena in (NH4)2SO4 single crystal

R. H. Chen*, Yu Chao Chen, C. S. Shern, T. Fukami

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

16 Citations (Scopus)


AC impedance measurements have been carried out on (NH4)2SO4 single crystals for the temperatures from 300 to 473 K and frequency range between 100 Hz and 4 MHz. The results reveal two distinct relaxation processes in the sample crystal. One is the dipolar relaxation with a peak at frequency slightly higher than 4 × 106 Hz. The other is the charge carrier relaxation at lower frequencies. The frequency dependence of conductivity is described by the relation σ(ω) = Bωn, and n = 1.32 is obtained at temperatures below 413 K. This value drops to 0.2 and then decreases slightly with increasing temperature. The dipolar response of the (NH4)2SO4 single crystal under an ac field is attributed to the reorientation of dipoles. The contribution of charge carriers is increasing substantially with increasing temperature at temperatures above 413 K. The temperature variation of conductivity relaxation peaks follows the Arrhenius relation. The obtained activation energy for migration of the mobile ions for (NH4)2SO4 single crystal was 1.24 eV in the temperature range between 433 and 468 K in this intrinsic region. It is proposed that the NH4+ in the sample crystal has the contribution to the electrical conduction.

Original languageEnglish
Pages (from-to)356-361
Number of pages6
JournalSolid State Ionics
Issue number4-5
Publication statusPublished - 2009 Apr 27


  • (NH)SO
  • Dielectric properties
  • Impedance spectroscopy
  • Ionic conductivity

ASJC Scopus subject areas

  • General Chemistry
  • General Materials Science
  • Condensed Matter Physics


Dive into the research topics of 'Conductivity and dielectric relaxation phenomena in (NH4)2SO4 single crystal'. Together they form a unique fingerprint.

Cite this