Compton Profiles of Silver with 662 keV γ-Rays

Chu Nan Chang, Syh Bin Lee, Chuhn Chih Chen

Research output: Contribution to journalArticlepeer-review

7 Citations (Scopus)


The isotropic Compton profiles of Ag for two thicknesses, 2 mm and 4 mm, have been measured by means of 662 keV γ-rays from Cs137 source. A HpGe detector with resolution of 190 eV at 5.9 keV was used to detect the backward scattering photons. Comparison with the renormalized-free-atom model calculations was made, and the agreement between the experimental and the calculated values has been found to be good for the electron configuration 4d105s1.

Original languageEnglish
Pages (from-to)4253-4264
Number of pages12
JournalJournal of the Physical Society of Japan
Issue number12
Publication statusPublished - 1991 Dec

ASJC Scopus subject areas

  • General Physics and Astronomy


Dive into the research topics of 'Compton Profiles of Silver with 662 keV γ-Rays'. Together they form a unique fingerprint.

Cite this