Compton Profiles of Silver with 662 keV γ-Rays

Chu-Nan Chang, Syh Bin Lee, Chuhn Chih Chen

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Abstract

The isotropic Compton profiles of Ag for two thicknesses, 2 mm and 4 mm, have been measured by means of 662 keV γ-rays from Cs137 source. A HpGe detector with resolution of 190 eV at 5.9 keV was used to detect the backward scattering photons. Comparison with the renormalized-free-atom model calculations was made, and the agreement between the experimental and the calculated values has been found to be good for the electron configuration 4d105s1.

Original languageEnglish
Pages (from-to)4253-4264
Number of pages12
JournalJournal of the Physical Society of Japan
Volume60
Issue number12
DOIs
Publication statusPublished - 1991 Jan 1

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ASJC Scopus subject areas

  • Physics and Astronomy(all)

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