Comprehensive Low-Frequency and RF Noise Characteristics in Strained-Si NMOSFETs

Min-Hung Lee, P. S. Chen, W. C. Hua, C. Y. Yu, Y. T. Tseng, S. Maikap, Y. M. Hsu, C. W. Liu, S. C. Lu, W. Y. Hsieh, M. J. Tsai

Research output: Contribution to journalConference article

20 Citations (Scopus)

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