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Comprehensive Low-Frequency and RF Noise Characteristics in Strained-Si NMOSFETs
M. H. Lee*, P. S. Chen, W. C. Hua, C. Y. Yu, Y. T. Tseng, S. Maikap, Y. M. Hsu, C. W. Liu, S. C. Lu, W. Y. Hsieh, M. J. Tsai
*Corresponding author for this work
Research output: Contribution to journal › Conference article › peer-review
21
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(Scopus)