Comprehensive Low-Frequency and RF Noise Characteristics in Strained-Si NMOSFETs
- M. H. Lee*
- , P. S. Chen
- , W. C. Hua
- , C. Y. Yu
- , Y. T. Tseng
- , S. Maikap
- , Y. M. Hsu
- , C. W. Liu
- , S. C. Lu
- , W. Y. Hsieh
- , M. J. Tsai
*Corresponding author for this work
Research output: Contribution to journal › Conference article › peer-review
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