Compositional determination of oxygen-exposed Co/Ge(1 1 1) film: Surfactant effect

C. W. Lai; Y. L. Chiou; H. W. Chang; W. Y. Chan; K. J. Hwang; J. S. Tsay; Y. D. Yao

doi:10.1016/j.jmmm.2006.01.183

Compositional determination of oxygen-exposed Co/Ge(1 1 1) film: Surfactant effect

C. W. Lai^*, Y. L. Chiou, H. W. Chang, W. Y. Chan, K. J. Hwang, J. S. Tsay, Y. D. Yao

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

2 Citations (Scopus)

Abstract

We apply the Monte Carlo simulation with Auger sputtering depth profiling to quantitatively determine the distribution of oxygen in the film O/Co/Ge(1 1 1). The well fitting curves of experimental data and simulation reveal a crucial fact that oxygen is highly mobile, has strong tendency to float out to the surface during subsequent oxygen exposure and cobalt deposition, and behaves as surfactant in this system. The simulation results show that full oxygen should be on the topmost layer, 88-90% oxygen is in the second layer, 77-80% oxygen is in third layer, and 57-60% oxygen is in fourth layer of the O/Co/Ge(1 1 1) system.

Original language	English
Pages (from-to)	e75-e77
Journal	Journal of Magnetism and Magnetic Materials
Volume	304
Issue number	1
DOIs	https://doi.org/10.1016/j.jmmm.2006.01.183
Publication status	Published - 2006 Sept
Externally published	Yes

Keywords

Auger electron spectroscopy
Depth profiling
Monte Carlo simulation
Surfactant

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics

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10.1016/j.jmmm.2006.01.183

Cite this

@article{df824f0a6dda42268d84f472c51bf53c,

title = "Compositional determination of oxygen-exposed Co/Ge(1 1 1) film: Surfactant effect",

abstract = "We apply the Monte Carlo simulation with Auger sputtering depth profiling to quantitatively determine the distribution of oxygen in the film O/Co/Ge(1 1 1). The well fitting curves of experimental data and simulation reveal a crucial fact that oxygen is highly mobile, has strong tendency to float out to the surface during subsequent oxygen exposure and cobalt deposition, and behaves as surfactant in this system. The simulation results show that full oxygen should be on the topmost layer, 88-90% oxygen is in the second layer, 77-80% oxygen is in third layer, and 57-60% oxygen is in fourth layer of the O/Co/Ge(1 1 1) system.",

keywords = "Auger electron spectroscopy, Depth profiling, Monte Carlo simulation, Surfactant",

author = "Lai, {C. W.} and Chiou, {Y. L.} and Chang, {H. W.} and Chan, {W. Y.} and Hwang, {K. J.} and Tsay, {J. S.} and Yao, {Y. D.}",

note = "Funding Information: Authors acknowledge support from the National Science Council of ROC with contract No. NSC94-2120-M-001-004. ",

year = "2006",

month = sep,

doi = "10.1016/j.jmmm.2006.01.183",

language = "English",

volume = "304",

pages = "e75--e77",

journal = "Journal of Magnetism and Magnetic Materials",

issn = "0304-8853",

publisher = "Elsevier",

number = "1",

}

TY - JOUR

T1 - Compositional determination of oxygen-exposed Co/Ge(1 1 1) film

T2 - Surfactant effect

AU - Lai, C. W.

AU - Chiou, Y. L.

AU - Chang, H. W.

AU - Chan, W. Y.

AU - Hwang, K. J.

AU - Tsay, J. S.

AU - Yao, Y. D.

N1 - Funding Information: Authors acknowledge support from the National Science Council of ROC with contract No. NSC94-2120-M-001-004.

PY - 2006/9

Y1 - 2006/9

N2 - We apply the Monte Carlo simulation with Auger sputtering depth profiling to quantitatively determine the distribution of oxygen in the film O/Co/Ge(1 1 1). The well fitting curves of experimental data and simulation reveal a crucial fact that oxygen is highly mobile, has strong tendency to float out to the surface during subsequent oxygen exposure and cobalt deposition, and behaves as surfactant in this system. The simulation results show that full oxygen should be on the topmost layer, 88-90% oxygen is in the second layer, 77-80% oxygen is in third layer, and 57-60% oxygen is in fourth layer of the O/Co/Ge(1 1 1) system.

AB - We apply the Monte Carlo simulation with Auger sputtering depth profiling to quantitatively determine the distribution of oxygen in the film O/Co/Ge(1 1 1). The well fitting curves of experimental data and simulation reveal a crucial fact that oxygen is highly mobile, has strong tendency to float out to the surface during subsequent oxygen exposure and cobalt deposition, and behaves as surfactant in this system. The simulation results show that full oxygen should be on the topmost layer, 88-90% oxygen is in the second layer, 77-80% oxygen is in third layer, and 57-60% oxygen is in fourth layer of the O/Co/Ge(1 1 1) system.

KW - Auger electron spectroscopy

KW - Depth profiling

KW - Monte Carlo simulation

KW - Surfactant

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DO - 10.1016/j.jmmm.2006.01.183

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SN - 0304-8853

VL - 304

SP - e75-e77

JO - Journal of Magnetism and Magnetic Materials

JF - Journal of Magnetism and Magnetic Materials

IS - 1

ER -

Compositional determination of oxygen-exposed Co/Ge(1 1 1) film: Surfactant effect

Abstract

Keywords

ASJC Scopus subject areas

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