Comparison and correlation of ESD HBM (Human Body Model) obtained between TLPG, wafer-level, and package-level tests

Ming T. Lee; Chuan H. Liu; Chung Chiang Lin; Jin Tau Chou; Howard T.H. Tang; Yih J. Chang; K. Y. Fu

Comparison and correlation of ESD HBM (Human Body Model) obtained between TLPG, wafer-level, and package-level tests

Ming T. Lee^*, Chuan H. Liu, Chung Chiang Lin, Jin Tau Chou, Howard T.H. Tang, Yih J. Chang, K. Y. Fu

^*Corresponding author for this work

Research output: Contribution to journal › Conference article › peer-review

7 Citations (Scopus)

Abstract

Transmission-line pulse generator (TLPG) was found to be well correlated to human body model (HBM) by adding a parasitic series resistance. The series resistance was obtained either from the least squares error solution method or numerically from simplified LEM method. Experimental results revealed that the HBM is best described by the lognormal distribution rather than normal distribution.

Original language	English
Pages (from-to)	105-110
Number of pages	6
Journal	Electrical Overstress/Electrostatic Discharge Symposium Proceedings
Publication status	Published - 2000
Externally published	Yes
Event	Electrical Overstress/Electrostatic Discharge Symposium Proceedings - Anaheim, CA, USA Duration: 2000 Sept 26 → 2000 Sept 28

ASJC Scopus subject areas

Condensed Matter Physics

Cite this

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title = "Comparison and correlation of ESD HBM (Human Body Model) obtained between TLPG, wafer-level, and package-level tests",

abstract = "Transmission-line pulse generator (TLPG) was found to be well correlated to human body model (HBM) by adding a parasitic series resistance. The series resistance was obtained either from the least squares error solution method or numerically from simplified LEM method. Experimental results revealed that the HBM is best described by the lognormal distribution rather than normal distribution.",

author = "Lee, {Ming T.} and Liu, {Chuan H.} and Lin, {Chung Chiang} and Chou, {Jin Tau} and Tang, {Howard T.H.} and Chang, {Yih J.} and Fu, {K. Y.}",

year = "2000",

language = "English",

pages = "105--110",

journal = "Electrical Overstress/Electrostatic Discharge Symposium Proceedings",

issn = "0739-5159",

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note = "Electrical Overstress/Electrostatic Discharge Symposium Proceedings ; Conference date: 26-09-2000 Through 28-09-2000",

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T1 - Comparison and correlation of ESD HBM (Human Body Model) obtained between TLPG, wafer-level, and package-level tests

AU - Lee, Ming T.

AU - Liu, Chuan H.

AU - Lin, Chung Chiang

AU - Chou, Jin Tau

AU - Tang, Howard T.H.

AU - Chang, Yih J.

AU - Fu, K. Y.

PY - 2000

Y1 - 2000

N2 - Transmission-line pulse generator (TLPG) was found to be well correlated to human body model (HBM) by adding a parasitic series resistance. The series resistance was obtained either from the least squares error solution method or numerically from simplified LEM method. Experimental results revealed that the HBM is best described by the lognormal distribution rather than normal distribution.

AB - Transmission-line pulse generator (TLPG) was found to be well correlated to human body model (HBM) by adding a parasitic series resistance. The series resistance was obtained either from the least squares error solution method or numerically from simplified LEM method. Experimental results revealed that the HBM is best described by the lognormal distribution rather than normal distribution.

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M3 - Conference article

AN - SCOPUS:0034543579

SN - 0739-5159

SP - 105

EP - 110

JO - Electrical Overstress/Electrostatic Discharge Symposium Proceedings

JF - Electrical Overstress/Electrostatic Discharge Symposium Proceedings

T2 - Electrical Overstress/Electrostatic Discharge Symposium Proceedings

Y2 - 26 September 2000 through 28 September 2000

ER -

Comparison and correlation of ESD HBM (Human Body Model) obtained between TLPG, wafer-level, and package-level tests

Abstract

ASJC Scopus subject areas

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