Comparison and correlation of ESD HBM (Human Body Model) obtained between TLPG, wafer-level, and package-level tests

Ming T. Lee, Chuan H. Liu, Chung Chiang Lin, Jin Tau Chou, Howard T.H. Tang, Yih J. Chang, K. Y. Fu

Research output: Contribution to journalConference article

2 Citations (Scopus)

Abstract

Transmission-line pulse generator (TLPG) was found to be well correlated to human body model (HBM) by adding a parasitic series resistance. The series resistance was obtained either from the least squares error solution method or numerically from simplified LEM method. Experimental results revealed that the HBM is best described by the lognormal distribution rather than normal distribution.

Original languageEnglish
Pages (from-to)105-110
Number of pages6
JournalElectrical Overstress/Electrostatic Discharge Symposium Proceedings
Publication statusPublished - 2000 Dec 1
EventElectrical Overstress/Electrostatic Discharge Symposium Proceedings - Anaheim, CA, USA
Duration: 2000 Sep 262000 Sep 28

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pulse generators
human body
transmission lines
Lunar Module
wafers
normal density functions

ASJC Scopus subject areas

  • Condensed Matter Physics

Cite this

Comparison and correlation of ESD HBM (Human Body Model) obtained between TLPG, wafer-level, and package-level tests. / Lee, Ming T.; Liu, Chuan H.; Lin, Chung Chiang; Chou, Jin Tau; Tang, Howard T.H.; Chang, Yih J.; Fu, K. Y.

In: Electrical Overstress/Electrostatic Discharge Symposium Proceedings, 01.12.2000, p. 105-110.

Research output: Contribution to journalConference article

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