Compact and low-loss ESD protection design for V-band RF applications in a 65-nm CMOS technology

Li Wei Chu, Chun Yu Lin, Shiang Yu Tsai, Ming Dou Ker, Ming Hsiang Song, Chewn Pu Jou, Tse Hua Lu, Jen Chou Tseng, Ming Hsien Tsai, Tsun Lai Hsu, Ping Fang Hung, Tzu Heng Chang

Research output: Contribution to conferencePaper

1 Citation (Scopus)

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Engineering & Materials Science