Colored timed Petri-Net and GA based approach to modeling and scheduling for wafer probe center

Shun Yu Lin; Li Chen Fu; Tsung Che Chiang; Yi Shiuan Shen

Colored timed Petri-Net and GA based approach to modeling and scheduling for wafer probe center

Shun Yu Lin^*, Li Chen Fu, Tsung Che Chiang, Yi Shiuan Shen

^*Corresponding author for this work

Research output: Contribution to journal › Conference article › peer-review

20 Citations (Scopus)

Abstract

In this paper, we propose an architecture to simulate Wafer Probe. We use a modeling tool named CTPN (Colored-Timed Petri Nets) to model all testing flow. With CTPN model, we can predict the delivery date of any specific product under some scheduling policies efficiently and precisely. In the scheduling phase, we combine two popular methods to construct high-quality schedules. One is to select machines for lots and the other is to select lots for machines. In each method, we use the GA-based approach to search for the optimal combination of a number of heuristic rules. This CTPN-based GA scheduler and selection method enlarges the solution space and helps us to find the good solution so as to meet the requirements in the complicated environment.

Original language	English
Pages (from-to)	1434-1439
Number of pages	6
Journal	Proceedings - IEEE International Conference on Robotics and Automation
Volume	1
Publication status	Published - 2003
Externally published	Yes
Event	2003 IEEE International Conference on Robotics and Automation - Taipei, Taiwan Duration: 2003 Sept 14 → 2003 Sept 19

ASJC Scopus subject areas

Software
Control and Systems Engineering
Artificial Intelligence
Electrical and Electronic Engineering

Cite this

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title = "Colored timed Petri-Net and GA based approach to modeling and scheduling for wafer probe center",

abstract = "In this paper, we propose an architecture to simulate Wafer Probe. We use a modeling tool named CTPN (Colored-Timed Petri Nets) to model all testing flow. With CTPN model, we can predict the delivery date of any specific product under some scheduling policies efficiently and precisely. In the scheduling phase, we combine two popular methods to construct high-quality schedules. One is to select machines for lots and the other is to select lots for machines. In each method, we use the GA-based approach to search for the optimal combination of a number of heuristic rules. This CTPN-based GA scheduler and selection method enlarges the solution space and helps us to find the good solution so as to meet the requirements in the complicated environment.",

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journal = "Proceedings - IEEE International Conference on Robotics and Automation",

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note = "2003 IEEE International Conference on Robotics and Automation ; Conference date: 14-09-2003 Through 19-09-2003",

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T1 - Colored timed Petri-Net and GA based approach to modeling and scheduling for wafer probe center

AU - Lin, Shun Yu

AU - Fu, Li Chen

AU - Chiang, Tsung Che

AU - Shen, Yi Shiuan

PY - 2003

Y1 - 2003

N2 - In this paper, we propose an architecture to simulate Wafer Probe. We use a modeling tool named CTPN (Colored-Timed Petri Nets) to model all testing flow. With CTPN model, we can predict the delivery date of any specific product under some scheduling policies efficiently and precisely. In the scheduling phase, we combine two popular methods to construct high-quality schedules. One is to select machines for lots and the other is to select lots for machines. In each method, we use the GA-based approach to search for the optimal combination of a number of heuristic rules. This CTPN-based GA scheduler and selection method enlarges the solution space and helps us to find the good solution so as to meet the requirements in the complicated environment.

AB - In this paper, we propose an architecture to simulate Wafer Probe. We use a modeling tool named CTPN (Colored-Timed Petri Nets) to model all testing flow. With CTPN model, we can predict the delivery date of any specific product under some scheduling policies efficiently and precisely. In the scheduling phase, we combine two popular methods to construct high-quality schedules. One is to select machines for lots and the other is to select lots for machines. In each method, we use the GA-based approach to search for the optimal combination of a number of heuristic rules. This CTPN-based GA scheduler and selection method enlarges the solution space and helps us to find the good solution so as to meet the requirements in the complicated environment.

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AN - SCOPUS:0344013423

SN - 1050-4729

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JO - Proceedings - IEEE International Conference on Robotics and Automation

JF - Proceedings - IEEE International Conference on Robotics and Automation

T2 - 2003 IEEE International Conference on Robotics and Automation

Y2 - 14 September 2003 through 19 September 2003

ER -

Colored timed Petri-Net and GA based approach to modeling and scheduling for wafer probe center

Abstract

ASJC Scopus subject areas

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