Characterizing xBa (Mg1/3Ta2/3)O3+ (1-x) Ba (Mg1/3Nb2/3)O3 microwave ceramics using extended x-ray absorption fine structure method

P. J. Chang, C. T. Chia*, I. N. Lin, J. F. Lee, C. M. Lin, K. T. Wu

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

11 Citations (Scopus)

Abstract

The structures of Ta O6 and Nb O6 oxygen octahedra in xBa (Mg13 Ta23) O3 + (1-x) Ba (Mg13 Nb23) O3 perovskite ceramics with x=0, 0.25, 0.50, 0.75, and 1.0 were investigated by the extended x-ray absorption fine structure method. The decline in the microwave dielectric constant as x increases is caused mainly by the decrease of the mean volume of the oxygen octahedra, regardless of the 1:2 ordered structure and the distortion of the oxygen octahedron. The low Qf values of the Ta O6 and Nb O6 mixed samples are caused by not only the degrading of the 1:2 ordered structure but also the distortion of oxygen octahedral cages.

Original languageEnglish
Article number242907
JournalApplied Physics Letters
Volume88
Issue number24
DOIs
Publication statusPublished - 2006 Jun 12

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Fingerprint

Dive into the research topics of 'Characterizing xBa (Mg1/3Ta2/3)O3+ (1-x) Ba (Mg1/3Nb2/3)O3 microwave ceramics using extended x-ray absorption fine structure method'. Together they form a unique fingerprint.

Cite this