Characterizing spatio-temporal phase variation of pixelated liquid crystal on silicon using digital holographic microscopy

Yu Chih Lin, Han Yen Tu, Chau Jern Cheng

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    1 Citation (Scopus)

    Abstract

    A spatio-temporal measurement technique for observing the phase variation of the LCoS devices using digital holographic microscopy is proposed. The spatial distribution of phase variation in pixelated field was measured and characterized in millisecond scale.

    Original languageEnglish
    Title of host publicationDigital Holography and Three-Dimensional Imaging, DH 2015
    PublisherOptical Society of America (OSA)
    Pages410p
    ISBN (Electronic)9781557529916
    DOIs
    Publication statusPublished - 2015 May 18
    EventDigital Holography and Three-Dimensional Imaging, DH 2015 - Shanghai , China
    Duration: 2015 May 242015 May 28

    Publication series

    NameDigital Holography and Three-Dimensional Imaging, DH 2015

    Other

    OtherDigital Holography and Three-Dimensional Imaging, DH 2015
    Country/TerritoryChina
    CityShanghai
    Period2015/05/242015/05/28

    ASJC Scopus subject areas

    • Atomic and Molecular Physics, and Optics
    • Electrical and Electronic Engineering
    • Electronic, Optical and Magnetic Materials
    • Computer Graphics and Computer-Aided Design

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