Characterizing spatio-temporal phase variation of pixelated liquid crystal on silicon using digital holographic microscopy

Yu Chih Lin, Han Yen Tu, Chau Jern Cheng

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

A spatio-temporal measurement technique for observing the phase variation of the LCoS devices using digital holographic microscopy is proposed. The spatial distribution of phase variation in pixelated field was measured and characterized in millisecond scale.

Original languageEnglish
Title of host publicationDigital Holography and Three-Dimensional Imaging, DH 2015
PublisherOptical Society of America (OSA)
Pages410p
ISBN (Electronic)9781557529916
DOIs
Publication statusPublished - 2015 May 18
EventDigital Holography and Three-Dimensional Imaging, DH 2015 - Shanghai , China
Duration: 2015 May 242015 May 28

Publication series

NameDigital Holography and Three-Dimensional Imaging, DH 2015

Other

OtherDigital Holography and Three-Dimensional Imaging, DH 2015
CountryChina
CityShanghai
Period15/5/2415/5/28

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics
  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Computer Graphics and Computer-Aided Design

Fingerprint Dive into the research topics of 'Characterizing spatio-temporal phase variation of pixelated liquid crystal on silicon using digital holographic microscopy'. Together they form a unique fingerprint.

Cite this