Characterizing spatio-temporal phase variation of pixelated liquid crystal on silicon using digital holographic microscopy

Yu Chih Lin, Han Yen Tu, Chau Jern Cheng

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    1 Citation (Scopus)

    Abstract

    A spatio-temporal measurement technique for observing the phase variation of the LCoS devices using digital holographic microscopy is proposed. The spatial distribution of phase variation in pixelated field was measured and characterized in millisecond scale.

    Original languageEnglish
    Title of host publicationDigital Holography and Three-Dimensional Imaging, DH 2015
    PublisherOptical Society of America (OSA)
    Pages410p
    ISBN (Electronic)9781557529916
    Publication statusPublished - 2015 Jan 1
    EventDigital Holography and Three-Dimensional Imaging, DH 2015 - Shanghai , China
    Duration: 2015 May 242015 May 28

    Other

    OtherDigital Holography and Three-Dimensional Imaging, DH 2015
    CountryChina
    CityShanghai
    Period15/5/2415/5/28

    Fingerprint

    Digital devices
    Liquid Crystals
    Silicon
    Liquid crystals
    Spatial distribution
    Microscopic examination
    liquid crystals
    microscopy
    silicon
    spatial distribution

    ASJC Scopus subject areas

    • Atomic and Molecular Physics, and Optics
    • Electrical and Electronic Engineering
    • Electronic, Optical and Magnetic Materials
    • Computer Graphics and Computer-Aided Design

    Cite this

    Lin, Y. C., Tu, H. Y., & Cheng, C. J. (2015). Characterizing spatio-temporal phase variation of pixelated liquid crystal on silicon using digital holographic microscopy. In Digital Holography and Three-Dimensional Imaging, DH 2015 (pp. 410p). Optical Society of America (OSA).

    Characterizing spatio-temporal phase variation of pixelated liquid crystal on silicon using digital holographic microscopy. / Lin, Yu Chih; Tu, Han Yen; Cheng, Chau Jern.

    Digital Holography and Three-Dimensional Imaging, DH 2015. Optical Society of America (OSA), 2015. p. 410p.

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Lin, YC, Tu, HY & Cheng, CJ 2015, Characterizing spatio-temporal phase variation of pixelated liquid crystal on silicon using digital holographic microscopy. in Digital Holography and Three-Dimensional Imaging, DH 2015. Optical Society of America (OSA), pp. 410p, Digital Holography and Three-Dimensional Imaging, DH 2015, Shanghai , China, 15/5/24.
    Lin YC, Tu HY, Cheng CJ. Characterizing spatio-temporal phase variation of pixelated liquid crystal on silicon using digital holographic microscopy. In Digital Holography and Three-Dimensional Imaging, DH 2015. Optical Society of America (OSA). 2015. p. 410p
    Lin, Yu Chih ; Tu, Han Yen ; Cheng, Chau Jern. / Characterizing spatio-temporal phase variation of pixelated liquid crystal on silicon using digital holographic microscopy. Digital Holography and Three-Dimensional Imaging, DH 2015. Optical Society of America (OSA), 2015. pp. 410p
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