Characterization of UV-modulated dielectric constant of ZnO thin films

Jen-Je Chieh, Y. P. Chen, Shieh-Yueh Yang, Herng-Er Horng, Chin Yih Hong, Hong-Chang Yang

    Research output: Contribution to journalArticle

    1 Citation (Scopus)

    Abstract

    The modulation on complex dielectric constant of ZnO thin film with ultraviolet (UV) light is investigated by common-path heterodyne interferometer in visible range. The results indicate that the dielectric constant of ZnO thin film is reduced under UV irradiation. The dielectric constant recovers when the UV irradiation vanishes. As the dielectric constant is related to the charge density of bounded electrons, or so-called valence electrons, the influence of UV irradiation on the resistance of ZnO thin film was studied to clarify the physical mechanism associated with the UV-modulated dielectric constant. It was observed that a smaller resistance was achieved for ZnO thin film under UV irradiation. This implies that the valence electrons absorb the irradiated UV and become conduction electrons.

    Original languageEnglish
    Pages (from-to)81-84
    Number of pages4
    JournalOptoelectronics and Advanced Materials, Rapid Communications
    Volume2
    Issue number2
    Publication statusPublished - 2008 Feb 1

    Fingerprint

    Permittivity
    Thin films
    Irradiation
    Electrons
    Charge density
    Interferometers
    Modulation

    Keywords

    • Refractive index
    • UV modulation
    • Zinc oxide

    ASJC Scopus subject areas

    • Electronic, Optical and Magnetic Materials
    • Electrical and Electronic Engineering

    Cite this

    Characterization of UV-modulated dielectric constant of ZnO thin films. / Chieh, Jen-Je; Chen, Y. P.; Yang, Shieh-Yueh; Horng, Herng-Er; Hong, Chin Yih; Yang, Hong-Chang.

    In: Optoelectronics and Advanced Materials, Rapid Communications, Vol. 2, No. 2, 01.02.2008, p. 81-84.

    Research output: Contribution to journalArticle

    Chieh, Jen-Je ; Chen, Y. P. ; Yang, Shieh-Yueh ; Horng, Herng-Er ; Hong, Chin Yih ; Yang, Hong-Chang. / Characterization of UV-modulated dielectric constant of ZnO thin films. In: Optoelectronics and Advanced Materials, Rapid Communications. 2008 ; Vol. 2, No. 2. pp. 81-84.
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