Abstract
Structure of nano-domes formed by Ga+ ion irradiation with a focused ion beam (FIB) apparatus onto GaN nanowires (NWs) was examined with conventional transmission electron microscopy (CTEM), electron energy-loss spectroscopy (EELS) and energy-filtering TEM (EF-TEM). The nano-dome consisted of metallic gallium, covered by a GaN layer, the structure of which is amorphous or liquid. It is considered that the dome structure is formed by preferential displacement of lighter element (N) and agglomeration of heavier one (Ga). 1 MeV electron irradiation onto the sample pre-irradiated by Ga+ ions at a dose below the threshold for the dome formation induced the N2 bubble formation without segregating Ga atoms, which suggests the radiation-enhanced diffusion (RED) of heavy atoms plays an important role in the nano-dome formation.
Original language | English |
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Pages (from-to) | 435-439 |
Number of pages | 5 |
Journal | Materials Transactions |
Volume | 45 |
Issue number | 2 |
DOIs | |
Publication status | Published - 2004 Feb |
Keywords
- Electron energy-loss spectroscopy
- Energy-filtering transmission electron microscopy
- GaN
- Ion bombardment
- Nanowires
- Transmission electron microscopy
ASJC Scopus subject areas
- General Materials Science
- Condensed Matter Physics
- Mechanics of Materials
- Mechanical Engineering