Characterization of magnetoimpedance on polycrystalline and amorphous chromium oxides bilayered thin films

C. M. Fu*, C. J. Lai, H. S. Hsu, Y. C. Chao, J. C.A. Huang, C. C. Wu, S. G. Shyu

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

6 Citations (Scopus)

Abstract

The impedance of chemical vapor deposited CrO 2 and Cr 2O 3 bilayered thin films, composed of polycrystalline and amorphous structure, have been systematically studied in function of frequency and temperature. In the polycrystalline-CrO 2/amorphous-Cr 2O 3 bilayer, the real part of impedance at low frequency (f<300kHz) demonstrates a sharp transition at temperature around 330 K, with a specific feature of positive temperature coefficient, similar to the variation of dc resistance occurs at ferroelectric-paraelectric transition in the BaTiO 3 ceramics. In contrast, the imaginary part of impedance, at frequency f>300kHz, shows a characteristic of negative temperature coefficient. Further analysis of the frequency dependence of the impedance shows the contribution from the dynamics of both the dielectric and magnetic dipoles in the layers. Comparison of polycrystalline-CrO 2 and amorphous-Cr 2O 3 single layer with the CrO 2/Cr 2O 3 bilayer is discussed.

Original languageEnglish
Pages (from-to)7143-7145
Number of pages3
JournalJournal of Applied Physics
Volume91
Issue number10 I
DOIs
Publication statusPublished - 2002 May 15
Externally publishedYes

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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