Abstract
I-V, V-O characteristics and atomic force images of grain boundary Josephson junctions fabricated on SrTiO, bicrystal substrates were investigated. The half integer Shapiro steps and I, versus B curves show evidence of the inhomogeneous current distribution along the grain boundary junction. The dc SQUID formed on the grain boundary shows the expected V-O curve. The AFM images, R-T curves and IeRn product reveal sequential destructive deterioration of the junction originating from the underlying grooved substrate. The results are discussed.
Original language | English |
---|---|
Pages (from-to) | 3101-3104 |
Number of pages | 4 |
Journal | IEEE Transactions on Applied Superconductivity |
Volume | 9 |
Issue number | 2 PART 3 |
DOIs | |
Publication status | Published - 1999 |
Externally published | Yes |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Electrical and Electronic Engineering