Characterization of grain boundaries in YBa2Cu3Oy bicrystal junctions

Hsiao-Wen Yu Hsiao-Wen, Ming Jye Chen, Hong Chang Yang, S. Y. Yang, H. E. Horng

Research output: Contribution to journalArticle

7 Citations (Scopus)

Abstract

I-V, V-O characteristics and atomic force images of grain boundary Josephson junctions fabricated on SrTiO, bicrystal substrates were investigated. The half integer Shapiro steps and I, versus B curves show evidence of the inhomogeneous current distribution along the grain boundary junction. The dc SQUID formed on the grain boundary shows the expected V-O curve. The AFM images, R-T curves and IeRn product reveal sequential destructive deterioration of the junction originating from the underlying grooved substrate. The results are discussed.

Original languageEnglish
Pages (from-to)3101-3104
Number of pages4
JournalIEEE Transactions on Applied Superconductivity
Volume9
Issue number2 PART 3
DOIs
Publication statusPublished - 1999 Dec 1

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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