Characterization of grain boundaries in YBa2Cu3Oy bicrystal junctions

Hsiao-Wen Yu Hsiao-Wen, Ming Jye Chen, Hong Chang Yang, S. Y. Yang, H. E. Horng

    Research output: Contribution to journalArticlepeer-review

    7 Citations (Scopus)


    I-V, V-O characteristics and atomic force images of grain boundary Josephson junctions fabricated on SrTiO, bicrystal substrates were investigated. The half integer Shapiro steps and I, versus B curves show evidence of the inhomogeneous current distribution along the grain boundary junction. The dc SQUID formed on the grain boundary shows the expected V-O curve. The AFM images, R-T curves and IeRn product reveal sequential destructive deterioration of the junction originating from the underlying grooved substrate. The results are discussed.

    Original languageEnglish
    Pages (from-to)3101-3104
    Number of pages4
    JournalIEEE Transactions on Applied Superconductivity
    Issue number2 PART 3
    Publication statusPublished - 1999 Dec 1

    ASJC Scopus subject areas

    • Electronic, Optical and Magnetic Materials
    • Condensed Matter Physics
    • Electrical and Electronic Engineering

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