Characteristics of YBa2Cu3O7-y Josephson junctions prepared with smooth ramp-edge surfaces

L. M. Wang*, H. H. Sung, H. C. Yang, M. J. Chen, C. H. Wu, N. L. Chiu, H. E. Horng

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

2 Citations (Scopus)


YBa2Cu3O7-y ramp-type Josephson junctions with PrBa2Cu3O7-y and SrTiO3 barriers have been fabricated on SrTiO3 (001) substrates. The surface morphology of the ramp-edge was examined using the atomic force microscope (AFM). The conditions of the photolithography process and the ion beam incident angle were optimized to improve the surface roughness at the ramp-edge. Typically, smooth surfaces at the ramp-edge with a ramp angle of about 25° and an average roughness of about 3 nm was achieved. Results indicate the junction properties are improved with a smooth ramp-edge surface. The details are discussed.

Original languageEnglish
Pages (from-to)2729-2730
Number of pages2
JournalPhysica C: Superconductivity and its applications
Volume341-348 (IV)
Publication statusPublished - 2000 Nov
EventInternational Conference on Materials and Mechanisms of Superconductivity High Temperature Superconductors VI - Houston, TX, USA
Duration: 2000 Feb 202000 Feb 25

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Energy Engineering and Power Technology
  • Electrical and Electronic Engineering


Dive into the research topics of 'Characteristics of YBa2Cu3O7-y Josephson junctions prepared with smooth ramp-edge surfaces'. Together they form a unique fingerprint.

Cite this