Characteristics of YBa2Cu3O7-y Josephson junctions prepared with smooth ramp-edge surfaces

L. M. Wang; H. H. Sung; H. C. Yang; M. J. Chen; C. H. Wu; N. L. Chiu; H. E. Horng

doi:10.1016/S0921-4534(00)01460-X

Characteristics of YBa₂Cu₃O_7-y Josephson junctions prepared with smooth ramp-edge surfaces

L. M. Wang^*, H. H. Sung, H. C. Yang, M. J. Chen, C. H. Wu, N. L. Chiu, H. E. Horng

^*Corresponding author for this work

Undergraduate Program of Electro-Optical Engineering

Research output: Contribution to journal › Conference article › peer-review

2 Citations (Scopus)

Abstract

YBa₂Cu₃O_7-y ramp-type Josephson junctions with PrBa₂Cu₃O_7-y and SrTiO₃ barriers have been fabricated on SrTiO₃ (001) substrates. The surface morphology of the ramp-edge was examined using the atomic force microscope (AFM). The conditions of the photolithography process and the ion beam incident angle were optimized to improve the surface roughness at the ramp-edge. Typically, smooth surfaces at the ramp-edge with a ramp angle of about 25° and an average roughness of about 3 nm was achieved. Results indicate the junction properties are improved with a smooth ramp-edge surface. The details are discussed.

Original language	English
Pages (from-to)	2729-2730
Number of pages	2
Journal	Physica C: Superconductivity and its applications
Volume	341-348 (IV)
DOIs	https://doi.org/10.1016/S0921-4534(00)01460-X
Publication status	Published - 2000 Nov
Event	International Conference on Materials and Mechanisms of Superconductivity High Temperature Superconductors VI - Houston, TX, USA Duration: 2000 Feb 20 → 2000 Feb 25

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Energy Engineering and Power Technology
Electrical and Electronic Engineering

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10.1016/S0921-4534(00)01460-X

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@article{e99dab30884940058e819ee9b7f1fd81,

title = "Characteristics of YBa2Cu3O7-y Josephson junctions prepared with smooth ramp-edge surfaces",

abstract = "YBa2Cu3O7-y ramp-type Josephson junctions with PrBa2Cu3O7-y and SrTiO3 barriers have been fabricated on SrTiO3 (001) substrates. The surface morphology of the ramp-edge was examined using the atomic force microscope (AFM). The conditions of the photolithography process and the ion beam incident angle were optimized to improve the surface roughness at the ramp-edge. Typically, smooth surfaces at the ramp-edge with a ramp angle of about 25° and an average roughness of about 3 nm was achieved. Results indicate the junction properties are improved with a smooth ramp-edge surface. The details are discussed.",

author = "Wang, {L. M.} and Sung, {H. H.} and Yang, {H. C.} and Chen, {M. J.} and Wu, {C. H.} and Chiu, {N. L.} and Horng, {H. E.}",

note = "Funding Information: *Supported by the National Science Council of lLO.C, under grant No. NSC 89-2112-M-212-001; International Conference on Materials and Mechanisms of Superconductivity High Temperature Superconductors VI ; Conference date: 20-02-2000 Through 25-02-2000",

year = "2000",

month = nov,

doi = "10.1016/S0921-4534(00)01460-X",

language = "English",

volume = "341-348 (IV)",

pages = "2729--2730",

journal = "Physica C: Superconductivity and its applications",

issn = "0921-4534",

publisher = "Elsevier",

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TY - JOUR

T1 - Characteristics of YBa2Cu3O7-y Josephson junctions prepared with smooth ramp-edge surfaces

AU - Wang, L. M.

AU - Sung, H. H.

AU - Yang, H. C.

AU - Chen, M. J.

AU - Wu, C. H.

AU - Chiu, N. L.

AU - Horng, H. E.

N1 - Funding Information: *Supported by the National Science Council of lLO.C, under grant No. NSC 89-2112-M-212-001

PY - 2000/11

Y1 - 2000/11

N2 - YBa2Cu3O7-y ramp-type Josephson junctions with PrBa2Cu3O7-y and SrTiO3 barriers have been fabricated on SrTiO3 (001) substrates. The surface morphology of the ramp-edge was examined using the atomic force microscope (AFM). The conditions of the photolithography process and the ion beam incident angle were optimized to improve the surface roughness at the ramp-edge. Typically, smooth surfaces at the ramp-edge with a ramp angle of about 25° and an average roughness of about 3 nm was achieved. Results indicate the junction properties are improved with a smooth ramp-edge surface. The details are discussed.

AB - YBa2Cu3O7-y ramp-type Josephson junctions with PrBa2Cu3O7-y and SrTiO3 barriers have been fabricated on SrTiO3 (001) substrates. The surface morphology of the ramp-edge was examined using the atomic force microscope (AFM). The conditions of the photolithography process and the ion beam incident angle were optimized to improve the surface roughness at the ramp-edge. Typically, smooth surfaces at the ramp-edge with a ramp angle of about 25° and an average roughness of about 3 nm was achieved. Results indicate the junction properties are improved with a smooth ramp-edge surface. The details are discussed.

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U2 - 10.1016/S0921-4534(00)01460-X

DO - 10.1016/S0921-4534(00)01460-X

M3 - Conference article

AN - SCOPUS:0343397360

SN - 0921-4534

VL - 341-348 (IV)

SP - 2729

EP - 2730

JO - Physica C: Superconductivity and its applications

JF - Physica C: Superconductivity and its applications

T2 - International Conference on Materials and Mechanisms of Superconductivity High Temperature Superconductors VI

Y2 - 20 February 2000 through 25 February 2000

ER -

Characteristics of YBa₂Cu₃O_7-y Josephson junctions prepared with smooth ramp-edge surfaces

Abstract

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