Characteristics and hot-carrier effects of strained pMOSFETs with SiGe channel and embedded SiGe source/drain stressors

Mu Chun Wang, Shea Jue Wang, Heng Sheng Huang, Shuang Yuan Chen, Min Ru Peng, Liang Ru Ji, Ming Feng Lu, Wen Shiang Liao, Chuan Hsi Liu

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Chemical Compounds

Engineering & Materials Science

Physics & Astronomy