Fingerprint
Dive into the research topics of 'Characteristics and hot-carrier effects of strained pMOSFETs with SiGe channel and embedded SiGe source/drain stressors'. Together they form a unique fingerprint.- Sort by
- Weight
- Alphabetically
Characteristics and hot-carrier effects of strained pMOSFETs with SiGe channel and embedded SiGe source/drain stressors
Mu Chun Wang, Shea Jue Wang*, Heng Sheng Huang, Shuang Yuan Chen, Min Ru Peng, Liang Ru Ji, Ming Feng Lu, Wen Shiang Liao, Chuan Hsi Liu
*Corresponding author for this work
Research output: Contribution to journal › Article › peer-review