Breakdown model and lifetime projection for thin gate oxide MOS devices

Chuan H. Liu*, Robert O. Grondin, Thomas A. DeMassa, Julian J. Sanchez

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

Fingerprint

Dive into the research topics of 'Breakdown model and lifetime projection for thin gate oxide MOS devices'. Together they form a unique fingerprint.

INIS

Material Science

Chemistry