Boundary scan for 5-GHz RF pins using LC isolation networks

Tian Wei Huang; Pei Si Wu; Ren Chieh Liu; Jeng Han Tsai; Huei Wang; Tzi Dar Chiueh

Boundary scan for 5-GHz RF pins using LC isolation networks

Tian Wei Huang^*, Pei Si Wu, Ren Chieh Liu, Jeng Han Tsai, Huei Wang, Tzi Dar Chiueh

^*Corresponding author for this work

Research output: Contribution to conference › Paper › peer-review

Abstract

The boundary-scan test provides a structural test solution for the densely packed digital electronics. For RF devices, the structural test also provides a good diagnostic resolution to the structural defects of RF circuits, especially for the high pin-count RF-SOCs. In this paper, the boundary-scan test is implemented on a 5-GHz RF pin using LC isolation networks to connect the RF lines and the boundary-scan cell, which isolates the RF circuitry from the digital boundary scan cell. This technique overcomes the parasitic loading problems and provides a minimum RF performance degradation to a RFIC. The measurement results show only 0.4-dB gain degradation in a 5-GHz amplifier with a boundary-scan cell and LC isolation networks.

Original language	English
Pages	347-350
Number of pages	4
Publication status	Published - 2004
Externally published	Yes
Event	Proceedings - 22nd IEEE VLSI Test Symposium - Napa Valley, CA, United States Duration: 2004 Apr 25 → 2004 Apr 29

Other

Other	Proceedings - 22nd IEEE VLSI Test Symposium
Country/Territory	United States
City	Napa Valley, CA
Period	2004/04/25 → 2004/04/29

ASJC Scopus subject areas

Computer Science Applications
Electrical and Electronic Engineering

Cite this

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title = "Boundary scan for 5-GHz RF pins using LC isolation networks",

abstract = "The boundary-scan test provides a structural test solution for the densely packed digital electronics. For RF devices, the structural test also provides a good diagnostic resolution to the structural defects of RF circuits, especially for the high pin-count RF-SOCs. In this paper, the boundary-scan test is implemented on a 5-GHz RF pin using LC isolation networks to connect the RF lines and the boundary-scan cell, which isolates the RF circuitry from the digital boundary scan cell. This technique overcomes the parasitic loading problems and provides a minimum RF performance degradation to a RFIC. The measurement results show only 0.4-dB gain degradation in a 5-GHz amplifier with a boundary-scan cell and LC isolation networks.",

author = "Huang, {Tian Wei} and Wu, {Pei Si} and Liu, {Ren Chieh} and Tsai, {Jeng Han} and Huei Wang and Chiueh, {Tzi Dar}",

year = "2004",

language = "English",

pages = "347--350",

note = "Proceedings - 22nd IEEE VLSI Test Symposium ; Conference date: 25-04-2004 Through 29-04-2004",

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TY - CONF

T1 - Boundary scan for 5-GHz RF pins using LC isolation networks

AU - Huang, Tian Wei

AU - Wu, Pei Si

AU - Liu, Ren Chieh

AU - Tsai, Jeng Han

AU - Wang, Huei

AU - Chiueh, Tzi Dar

PY - 2004

Y1 - 2004

N2 - The boundary-scan test provides a structural test solution for the densely packed digital electronics. For RF devices, the structural test also provides a good diagnostic resolution to the structural defects of RF circuits, especially for the high pin-count RF-SOCs. In this paper, the boundary-scan test is implemented on a 5-GHz RF pin using LC isolation networks to connect the RF lines and the boundary-scan cell, which isolates the RF circuitry from the digital boundary scan cell. This technique overcomes the parasitic loading problems and provides a minimum RF performance degradation to a RFIC. The measurement results show only 0.4-dB gain degradation in a 5-GHz amplifier with a boundary-scan cell and LC isolation networks.

AB - The boundary-scan test provides a structural test solution for the densely packed digital electronics. For RF devices, the structural test also provides a good diagnostic resolution to the structural defects of RF circuits, especially for the high pin-count RF-SOCs. In this paper, the boundary-scan test is implemented on a 5-GHz RF pin using LC isolation networks to connect the RF lines and the boundary-scan cell, which isolates the RF circuitry from the digital boundary scan cell. This technique overcomes the parasitic loading problems and provides a minimum RF performance degradation to a RFIC. The measurement results show only 0.4-dB gain degradation in a 5-GHz amplifier with a boundary-scan cell and LC isolation networks.

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M3 - Paper

AN - SCOPUS:3142686914

SP - 347

EP - 350

T2 - Proceedings - 22nd IEEE VLSI Test Symposium

Y2 - 25 April 2004 through 29 April 2004

ER -

Boundary scan for 5-GHz RF pins using LC isolation networks

Abstract

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ASJC Scopus subject areas

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