Abstract
This study calculated the contribution of electrons and holes to TiO 2 conductivity in Si/TiO 2/Ni structures by conducting experiments on the injection of minority carriers from n- and p-type silicon. Results show that electrons and holes contribute to the conductivity of TiO 2, enabling two-band conductivity.
Original language | English |
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Article number | 032101 |
Journal | Applied Physics Letters |
Volume | 101 |
Issue number | 3 |
DOIs | |
Publication status | Published - 2012 Jul 16 |
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)