Automatic functional test program generation for microprocessors.

Cheng Shang Lin; Hong Fa Ho

Automatic functional test program generation for microprocessors.

Cheng Shang Lin^*
, Hong Fa Ho

^*Corresponding author for this work

Department of Electrical Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

2 Citations (Scopus)

Abstract

A algorithm called the O-algorithm is introduced for automatic test program generation of microprocessors in a user environment. To eliminate redundant tests, a weighted-digraph model is used to model the signal flow of the general microprocessors. Improved functional fault models of microprocessors are derived from the Turing machine model. The O-algorithm is then constructed on the basis of the signal flow model and functional fault models. Simulation has shown that the fault coverage is better than 97%.

Original language	English
Title of host publication	Proceedings - Design Automation Conference
Publisher	Publ by IEEE
Pages	605-608
Number of pages	4
ISBN (Print)	0818688645
Publication status	Published - 1988

Publication series

Name	Proceedings - Design Automation Conference
ISSN (Print)	0146-7123

ASJC Scopus subject areas

General Engineering

Cite this

@inproceedings{13b54782c95245969594d4b88bc36934,

title = "Automatic functional test program generation for microprocessors.",

abstract = "A algorithm called the O-algorithm is introduced for automatic test program generation of microprocessors in a user environment. To eliminate redundant tests, a weighted-digraph model is used to model the signal flow of the general microprocessors. Improved functional fault models of microprocessors are derived from the Turing machine model. The O-algorithm is then constructed on the basis of the signal flow model and functional fault models. Simulation has shown that the fault coverage is better than 97\%.",

author = "Lin, \{Cheng Shang\} and Ho, \{Hong Fa\}",

year = "1988",

language = "English",

isbn = "0818688645",

series = "Proceedings - Design Automation Conference",

publisher = "Publ by IEEE",

pages = "605--608",

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TY - GEN

T1 - Automatic functional test program generation for microprocessors.

AU - Lin, Cheng Shang

AU - Ho, Hong Fa

PY - 1988

Y1 - 1988

N2 - A algorithm called the O-algorithm is introduced for automatic test program generation of microprocessors in a user environment. To eliminate redundant tests, a weighted-digraph model is used to model the signal flow of the general microprocessors. Improved functional fault models of microprocessors are derived from the Turing machine model. The O-algorithm is then constructed on the basis of the signal flow model and functional fault models. Simulation has shown that the fault coverage is better than 97%.

AB - A algorithm called the O-algorithm is introduced for automatic test program generation of microprocessors in a user environment. To eliminate redundant tests, a weighted-digraph model is used to model the signal flow of the general microprocessors. Improved functional fault models of microprocessors are derived from the Turing machine model. The O-algorithm is then constructed on the basis of the signal flow model and functional fault models. Simulation has shown that the fault coverage is better than 97%.

UR - https://www.scopus.com/pages/publications/0024133190

UR - https://www.scopus.com/pages/publications/0024133190#tab=citedBy

M3 - Conference contribution

AN - SCOPUS:0024133190

SN - 0818688645

T3 - Proceedings - Design Automation Conference

SP - 605

EP - 608

BT - Proceedings - Design Automation Conference

PB - Publ by IEEE

ER -

Automatic functional test program generation for microprocessors.

Abstract

Publication series

ASJC Scopus subject areas

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