Automatic functional test program generation for microprocessors.

Cheng Shang Lin*, Hong Fa Ho

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)


A algorithm called the O-algorithm is introduced for automatic test program generation of microprocessors in a user environment. To eliminate redundant tests, a weighted-digraph model is used to model the signal flow of the general microprocessors. Improved functional fault models of microprocessors are derived from the Turing machine model. The O-algorithm is then constructed on the basis of the signal flow model and functional fault models. Simulation has shown that the fault coverage is better than 97%.

Original languageEnglish
Title of host publicationProceedings - Design Automation Conference
PublisherPubl by IEEE
Number of pages4
ISBN (Print)0818688645
Publication statusPublished - 1988

Publication series

NameProceedings - Design Automation Conference
ISSN (Print)0146-7123

ASJC Scopus subject areas

  • General Engineering


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