Automatic functional test program generation for microprocessors.

Cheng Shang Lin, Hong-Fa Ho

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

A algorithm called the O-algorithm is introduced for automatic test program generation of microprocessors in a user environment. To eliminate redundant tests, a weighted-digraph model is used to model the signal flow of the general microprocessors. Improved functional fault models of microprocessors are derived from the Turing machine model. The O-algorithm is then constructed on the basis of the signal flow model and functional fault models. Simulation has shown that the fault coverage is better than 97%.

Original languageEnglish
Title of host publicationProceedings - Design Automation Conference
PublisherPubl by IEEE
Pages605-608
Number of pages4
ISBN (Print)0818688645
Publication statusPublished - 1988 Dec 1

Publication series

NameProceedings - Design Automation Conference
ISSN (Print)0146-7123

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ASJC Scopus subject areas

  • Engineering(all)

Cite this

Lin, C. S., & Ho, H-F. (1988). Automatic functional test program generation for microprocessors. In Proceedings - Design Automation Conference (pp. 605-608). (Proceedings - Design Automation Conference). Publ by IEEE.