Atomic-scale mapping of electronic structures across heterointerfaces by cross-sectional scanning tunneling microscopy

Ya-Ping Chiu, Bo Chao Huang, Min Chuan Shih, Po Cheng Huang, Chun Wei Chen

Research output: Contribution to journalReview article

Abstract

Interfacial science has received much attention recently based on the development of state-of-the-art analytical tools that can create and manipulate the charge, spin, orbital, and lattice degrees of freedom at interfaces. Motivated by the importance of nanoscale interfacial science that governs device operation, we present a technique to probe the electronic characteristics of heterointerfaces with atomic resolution. In this work, the interfacial characteristics of heteroepitaxial structures are investigated and the fundamental mechanisms that pertain in these systems are elucidated through cross-sectional scanning tunneling microscopy (XSTM). The XSTM technique is employed here to directly observe epitaxial interfacial structures and probe local electronic properties with atomic-level capability. Scanning tunneling microscopy and spectroscopy experiments with atomic precision provide insight into the origin and spatial distribution of electronic properties across heterointerfaces. The first part of this report provides a brief description of the cleavage technique and spectroscopy analysis in XSTM measurements. The second part addresses interfacial electronic structures of several model heterostructures in current condensed matter research using XSTM. Topics to be discussed include high-κ's/III-V's semiconductors, polymer heterojunctions, and complex oxide heterostructures, which are all material systems whose investigation using this technique is expected to benefit the research community. Finally, practical aspects and perspectives of using XSTM in interface science are presented.

Original languageEnglish
Article number343001
JournalJournal of Physics Condensed Matter
Volume27
Issue number34
DOIs
Publication statusPublished - 2015 Sep 4

Fingerprint

Scanning Tunnelling Microscopy
Scanning tunneling microscopy
Electronic structure
Heterojunctions
scanning tunneling microscopy
electronic structure
Electronic properties
Spectrum Analysis
electronics
Spectroscopy
Semiconductors
probes
Research
Oxides
Spatial distribution
spectroscopy
heterojunctions
cleavage
Polymers
spatial distribution

Keywords

  • electronic structure
  • heterostructures
  • interface
  • scanning tunneling spectroscopy

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics

Cite this

Atomic-scale mapping of electronic structures across heterointerfaces by cross-sectional scanning tunneling microscopy. / Chiu, Ya-Ping; Huang, Bo Chao; Shih, Min Chuan; Huang, Po Cheng; Chen, Chun Wei.

In: Journal of Physics Condensed Matter, Vol. 27, No. 34, 343001, 04.09.2015.

Research output: Contribution to journalReview article

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