Skip to main navigation
Skip to search
Skip to main content
National Taiwan Normal University Home
Help & FAQ
Link opens in a new tab
English
中文
Search content at National Taiwan Normal University
Home
Profiles
Research units
Research output
Projects
Press/Media
Datasets
Activities
Prizes
Student theses
Anomalous behavior of LEED beam intensity during annealing
Tsu Yi Fu
, T. F. Liu
, C. W. Su
, C. S. Shern
, R. H. Chen
Department of Physics
Research output
:
Contribution to journal
›
Article
›
peer-review
Overview
Fingerprint
Fingerprint
Dive into the research topics of 'Anomalous behavior of LEED beam intensity during annealing'. Together they form a unique fingerprint.
Sort by
Weight
Alphabetically
Engineering
Environmental Design
100%
Stable State
100%
Thin Films
100%
Photoelectron
100%
Interdiffusion
100%
Energy Electron Diffraction
100%
Annealing Effect
100%
INIS
annealing
100%
beams
100%
leed
100%
diffusion
50%
ultraviolet radiation
50%
low energy electron diffraction
50%
thin films
50%
auger electron spectroscopy
50%
photoelectron spectroscopy
50%
debye-waller factor
50%
Material Science
Annealing
100%
Low-Energy Electron Diffraction
100%
Auger Electron Spectroscopy
100%
Ultra Violet Photoemission Spectroscopy
100%
Ultrathin Film
100%
Chemistry
Low Energy Electron Diffraction
100%
Chlordiazepoxide
100%
Auger Electron Spectroscopy
50%
Ultrathin Film
50%
Ultra-Violet Photoelectron Spectroscopy
50%
Interdiffusion
50%
Chemical Engineering
Film
100%