Annealing effect of ultrathin Ag films on Ni/Pt (111)

C. W. Su, H. Y. Yo, Y. J. Chen, C. S. Shern*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

3 Citations (Scopus)

Abstract

The epitaxial growth and alloy formation of Ag-capped layer on NiPt (111) surface were investigated using Auger electron spectroscopy, ultraviolet photoelectron spectroscopy, and low-energy electron diffraction. The growth of Ag on one ML NiPt (111) transforms from layer-by-layer mode into three-dimensional island mode after the growth of one atomic monolayer of Ag. The starting temperature for the alloy formation of Ni-Pt is dependent of the thickness of Ni films. The interface compositions after the high-temperature annealing were studied with the depth-profile analysis of Ar ion sputtering.

Original languageEnglish
Article number124907
JournalJournal of Applied Physics
Volume97
Issue number12
DOIs
Publication statusPublished - 2005

ASJC Scopus subject areas

  • General Physics and Astronomy

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