Analysis of defect mode in a dielectric photonic crystal containing ITO defect

Chi Chung Liu, Chien Jang Wu

Research output: Contribution to journalArticle

8 Citations (Scopus)

Abstract

In this work, based on the use of ITO as a defect, we study the infrared defect mode in defective photonic crystal made of SiO2 and InP. Due to the dispersion in the dielectric function of ITO, it is found that the defect mode is sensitive to the ITO thickness. The defect frequency is shown to be blue-shifted as the thickness of ITO decreases. In the angular dependence of defect mode, it is seen that the defect frequency is also blue-shifted when the angle of incidence increases for both TE and TM polarizations. However, the shifting feature is appeared to be nearly polarization-independent. The shift in the defect frequency enables us to employ ITO as a tunable agent in order to design a tunable photonic crystal filter in the infrared region.

Original languageEnglish
Pages (from-to)7140-7142
Number of pages3
JournalOptik
Volume125
Issue number24
DOIs
Publication statusPublished - 2014 Dec 1

Fingerprint

Photonic crystals
ITO (semiconductors)
photonics
Defects
defects
crystals
Crystal filters
crystal filters
Polarization
Infrared radiation
polarization
incidence
shift

Keywords

  • Defect mode
  • ITO
  • Photonic crystals
  • Transfer matrix method

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Electrical and Electronic Engineering

Cite this

Analysis of defect mode in a dielectric photonic crystal containing ITO defect. / Liu, Chi Chung; Wu, Chien Jang.

In: Optik, Vol. 125, No. 24, 01.12.2014, p. 7140-7142.

Research output: Contribution to journalArticle

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