Abstract
A low-cost process with electron beam evaporator deposition for amorphous layers was demonstrated in hetero-junction with intrinsic thin layer (HIT) solar cell. The cleaning process with saw damage removal procedure and the annealing temperature are also discussed in this work. The open-circuit voltage (Voc) and short-circuit current density (Jsc) were obtained as 285 mV and 2.9 mA/cm2, respectively, with 5 min saw damage removal and 450°C forming gas annealing. Therefore, the low-cost process with the electron beam evaporator deposition could possibly fabricate the HIT solar cell and be a candidate for future higher performance photovoltaic device with optimisation process condition.
Original language | English |
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Pages (from-to) | 485-491 |
Number of pages | 7 |
Journal | International Journal of Nanotechnology |
Volume | 13 |
Issue number | 7 |
DOIs | |
Publication status | Published - 2016 |
Keywords
- Crystalline silicon
- Electron beam evaporation
- HIT
- Hetero-junction with intrinsic thin layer
- Heterojunction
- Photovoltaic
ASJC Scopus subject areas
- Bioengineering
- Condensed Matter Physics
- Electrical and Electronic Engineering
- Materials Chemistry