Alloy formation of Ni ultrathin films on Pt(1 1 1) with Ag buffer layers

H. Y. Ho, C. W. Su, Y. W. Chu, Ching-Song Shern

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

Low-energy electron diffraction (LEED), Auger electron spectroscopy (AES), and depth profiling were used to study growth mode and structure in the interfaces of Ni/Ag/Pt(1 1 1). An atomic exchange occurs between Ni and Ag when the annealing temperature is high enough and the starting exchange temperature does not depend on the thickness of Ni. Nevertheless, the complete exchange temperature is higher when the coverage of Ni increases. Experimental evidence shows that the Ni-Pt alloy develops after the atomic exchange between Ag and Ni is complete. The atomic exchange between Ag and Ni, and the formation of Ni-Pt alloy were confirmed by the depth profile. The mechanisms of the atomic exchange are discussed.

Original languageEnglish
Pages (from-to)306-310
Number of pages5
JournalApplied Surface Science
Volume237
Issue number1-4
DOIs
Publication statusPublished - 2004 Oct 15

Fingerprint

Ultrathin films
Buffer layers
buffers
Auger spectroscopy
electron spectroscopy
Depth profiling
electron diffraction
Low energy electron diffraction
Auger electron spectroscopy
Temperature
annealing
profiles
Annealing
temperature
energy

Keywords

  • Atomic exchange
  • Auger electron spectroscopy
  • Depth profile
  • Nickel
  • Platinum surface
  • Silver
  • Surface alloy

ASJC Scopus subject areas

  • Surfaces, Coatings and Films

Cite this

Alloy formation of Ni ultrathin films on Pt(1 1 1) with Ag buffer layers. / Ho, H. Y.; Su, C. W.; Chu, Y. W.; Shern, Ching-Song.

In: Applied Surface Science, Vol. 237, No. 1-4, 15.10.2004, p. 306-310.

Research output: Contribution to journalArticle

Ho, H. Y. ; Su, C. W. ; Chu, Y. W. ; Shern, Ching-Song. / Alloy formation of Ni ultrathin films on Pt(1 1 1) with Ag buffer layers. In: Applied Surface Science. 2004 ; Vol. 237, No. 1-4. pp. 306-310.
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