A study on frequency-dependent voltage nonlinearity of SrTiO3 rf capacitor

C. H. Cheng, C. C. Huang, H. H. Hsu, P. C. Chen, K. C. Chiang, Albert Chin, F. S. Yeh

Research output: Contribution to journalArticle

6 Citations (Scopus)

Abstract

In this article, we investigate the frequency-dependent voltage nonlinearity effect of high-κ Ni/SrTiO3/TaN and TaN/SrTiO 3/TaN radio-frequency (rf) metal-insulator-metal (MIM) capacitors by electrical and thermal stresses. The experimental results demonstrated that the MIM-related capacitance properties, dependence of voltage and frequency, are not only affected by intrinsic dielectric properties but also shared by extrinsic effect, which possibly originated from the oxygen vacancies or electrode polarization. The high work-function Ni electrode can prevent the frequency-dependent voltage coefficient of capacitance characteristics from deterioration under the high temperature or continued voltage-stressing environments.

Original languageEnglish
Pages (from-to)H436-H439
JournalElectrochemical and Solid-State Letters
Volume13
Issue number12
DOIs
Publication statusPublished - 2010 Oct 29

ASJC Scopus subject areas

  • Chemical Engineering(all)
  • Materials Science(all)
  • Physical and Theoretical Chemistry
  • Electrochemistry
  • Electrical and Electronic Engineering

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    Cheng, C. H., Huang, C. C., Hsu, H. H., Chen, P. C., Chiang, K. C., Chin, A., & Yeh, F. S. (2010). A study on frequency-dependent voltage nonlinearity of SrTiO3 rf capacitor. Electrochemical and Solid-State Letters, 13(12), H436-H439. https://doi.org/10.1149/1.3491490