A novel rewritable one-time-programming OTP (RW-OTP) realized by dielectric-fuse RRAM devices featuring ultra-high reliable retention and good endurance for embedded applications
- H. W. Cheng
- , E. R. Hsieh*
- , Z. H. Huang
- , C. H. Chuang
- , C. H. Chen
- , F. L. Li
- , Y. M. Lo
- , C. H. Liu
- , Steve S. Chung
*Corresponding author for this work
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
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