@inbook{c79d22d66e634fb593cb1b8d62d9da11,
title = "A Correlated Study of Nanotube/Nanowire Transistor Between TEM Inspection and Electrical Characterization",
abstract = "In this chapter, we introduce a novel method for a correlated study of nanowire/nanotube based on electrical measurements and electron microscope imaging. Two kinds of chip platforms are used, which named as the through-hole chip and the membrane chip, respectively. These kinds of chip platforms allow a physical correlation to be established for transmission electron microscopy inspection and electrical characterization. In order to demonstrate the correlated study, we conduct a few nanomaterials, including carbon nanotube, nanowire, and graphene derivatives, which are placed on top of the specific chips by manipulators. The results strongly indicate that the electrical property in the quasi-one-dimensional nanomaterials is sensitive to their structure such defect, contamination, and adsorption from environment.",
keywords = "Carbon nanotube, Graphene, Nanomaterials, Nanowire, Transmission electron microscopy",
author = "Lan, \{Yann Wen\} and Chen, \{Po Chun\}",
note = "Publisher Copyright: {\textcopyright} Springer Nature Singapore Pte Ltd. 2019.",
year = "2019",
doi = "10.1007/978-981-13-2367-6\_2",
language = "English",
series = "Nanostructure Science and Technology",
publisher = "Springer Publishing Company",
pages = "31--51",
booktitle = "Nanostructure Science and Technology",
address = "United States",
}