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A comparative study of microstructure of RuO2 nanorods via Raman scattering and field emission scanning electron microscopy
R. S. Chen, C. C. Chen, Y. S. Huang*, C. T. Chia, H. P. Chen, D. S. Tsai, K. K. Tiong
*Corresponding author for this work
Research output: Contribution to journal › Article › peer-review
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