Abstract
Raman scattering (RS) and field emission scanning electron microscopy (FESEM) have been used to extract microstructural information of RuO2 nanorods (NRs) and a two-phase system comprising NRs embedded in polycrystalline matrix deposited on different substrates by the metal-organic chemical vapor deposition method. The red shifts and asymmetric broadening of the Raman line shape for the NRs are analyzed by the spatial correlation model. The deduced spatial correlation length l is found to be much smaller than that of the average size L0 estimated from the FESEM images. The Raman features for the two-phase system can be resolved into two parts: a Lorentzian line shape feature corresponding to the polycrystallite at higher frequency side and an asymmetrically broadened NRs' signature located at lower frequency end. The volume fraction of NRs in the two-phase system can be determined from the analysis. These results demonstrate the significance of RS as a structural characterization method when used in conjunction with FESEM.
| Original language | English |
|---|---|
| Pages (from-to) | 349-353 |
| Number of pages | 5 |
| Journal | Solid State Communications |
| Volume | 131 |
| Issue number | 6 |
| DOIs | |
| Publication status | Published - 2004 Aug 1 |
Fingerprint
Keywords
- A. Nanostructures
- C. Field emission scanning electron microscopy
- E. Raman scattering
ASJC Scopus subject areas
- Chemistry(all)
- Condensed Matter Physics
- Materials Chemistry
Cite this
A comparative study of microstructure of RuO2 nanorods via Raman scattering and field emission scanning electron microscopy. / Chen, R. S.; Chen, C. C.; Huang, Y. S.; Chia, C. T.; Chen, H. P.; Tsai, D. S.; Tiong, K. K.
In: Solid State Communications, Vol. 131, No. 6, 01.08.2004, p. 349-353.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - A comparative study of microstructure of RuO2 nanorods via Raman scattering and field emission scanning electron microscopy
AU - Chen, R. S.
AU - Chen, C. C.
AU - Huang, Y. S.
AU - Chia, C. T.
AU - Chen, H. P.
AU - Tsai, D. S.
AU - Tiong, K. K.
PY - 2004/8/1
Y1 - 2004/8/1
N2 - Raman scattering (RS) and field emission scanning electron microscopy (FESEM) have been used to extract microstructural information of RuO2 nanorods (NRs) and a two-phase system comprising NRs embedded in polycrystalline matrix deposited on different substrates by the metal-organic chemical vapor deposition method. The red shifts and asymmetric broadening of the Raman line shape for the NRs are analyzed by the spatial correlation model. The deduced spatial correlation length l is found to be much smaller than that of the average size L0 estimated from the FESEM images. The Raman features for the two-phase system can be resolved into two parts: a Lorentzian line shape feature corresponding to the polycrystallite at higher frequency side and an asymmetrically broadened NRs' signature located at lower frequency end. The volume fraction of NRs in the two-phase system can be determined from the analysis. These results demonstrate the significance of RS as a structural characterization method when used in conjunction with FESEM.
AB - Raman scattering (RS) and field emission scanning electron microscopy (FESEM) have been used to extract microstructural information of RuO2 nanorods (NRs) and a two-phase system comprising NRs embedded in polycrystalline matrix deposited on different substrates by the metal-organic chemical vapor deposition method. The red shifts and asymmetric broadening of the Raman line shape for the NRs are analyzed by the spatial correlation model. The deduced spatial correlation length l is found to be much smaller than that of the average size L0 estimated from the FESEM images. The Raman features for the two-phase system can be resolved into two parts: a Lorentzian line shape feature corresponding to the polycrystallite at higher frequency side and an asymmetrically broadened NRs' signature located at lower frequency end. The volume fraction of NRs in the two-phase system can be determined from the analysis. These results demonstrate the significance of RS as a structural characterization method when used in conjunction with FESEM.
KW - A. Nanostructures
KW - C. Field emission scanning electron microscopy
KW - E. Raman scattering
UR - http://www.scopus.com/inward/record.url?scp=3042758878&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=3042758878&partnerID=8YFLogxK
U2 - 10.1016/j.ssc.2004.06.002
DO - 10.1016/j.ssc.2004.06.002
M3 - Article
AN - SCOPUS:3042758878
VL - 131
SP - 349
EP - 353
JO - Solid State Communications
JF - Solid State Communications
SN - 0038-1098
IS - 6
ER -