A 14-nm FinFET Logic CMOS Process Compatible RRAM Flash with Excellent Immunity to Sneak Path

E. Ray Hsieh, Yen Chen Kuo, Chih Hung Cheng, Jing Ling Kuo, Meng Ru Jiang, Jian Li Lin, Hung Wen Chen, Steve S. Chung*, Chuan Hsi Liu, Tse Pu Chen, Shih An Huang, Tai Ju Chen, Osbert Cheng

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

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Engineering & Materials Science

Chemical Compounds