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• 2020

  A pilot study on the association between the blood oxygen level-dependent signal in the reward system and dopamine transporter availability in adults with attention deficit hyperactivity disorder

  Lin, S. H., Chi, M. H., Lee, I. H., Chen, K. C., Tai, Y. C., Yao, W. J., Chiu, N. T., Yang, D. Y., Lin, C. Y., Chen, P. S. & Yang, Y. K., 2020, (Accepted/In press) In: CNS Spectrums.

  Research output: Contribution to journal › Article › peer-review

  • Dopamine Plasma Membrane Transport Proteins
  • Attention Deficit Disorder with Hyperactivity
  • Reward
  • Oxygen
  • Prefrontal Cortex

• Compact ESD Protection Cell for Multi-Band Millimeter-Wave Applications

  Lin, C. Y., Fu, Y. Q. & Wang, J. Y., 2020 Jan 1, In: IEEE Microwave and Wireless Components Letters. 30, 1, p. 58-61 4 p., 8947990.

  Research output: Contribution to journal › Article › peer-review

  • Electrostatic discharge
  • Millimeter waves
  • millimeter waves
  • electrostatics
  • cells

• Compact ESD Protection Design for CMOS Low-Noise Amplifier

  Lin, C. Y., Huang, G. L. & Lin, M. T., 2020 Jan, In: IEEE Transactions on Electron Devices. 67, 1, p. 33-39 7 p., 8933353.

  Research output: Contribution to journal › Article › peer-review

  • Electrostatic discharge
  • Low noise amplifiers
  • Clamping devices
  • Thyristors
  • Diodes
  1 Citation (Scopus)

• Design of Fin-Diode-Triggered Rotated Silicon-Controlled Rectifier for High- Speed Digital Application in 16-nm FinFET Process

  Chang, R. K., Lin, C. Y. & Ker, M. D., 2020 Jul, In: IEEE Transactions on Electron Devices. 67, 7, p. 2725-2731 7 p., 9103976.

  Research output: Contribution to journal › Article › peer-review

  • Electrostatic discharge
  • FinFET
  • Thyristors
  • Diodes
  • Digital circuits
  1 Citation (Scopus)

• Exploration of multi-target effects of 3-benzoyl-5-hydroxychromen-2-one in Alzheimer’s disease cell and mouse models

  Lin, T. H., Chiu, Y. J., Lin, C. H., Lin, C. Y., Chao, C. Y., Chen, Y. C., Yang, S. M., Lin, W., Mei Hsieh-Li, H., Wu, Y. R., Chang, K. H., Lee-Chen, G. J. & Chen, C. M., 2020 Jul 1, In: Aging Cell. 19, 7, ACEL13169.

  Research output: Contribution to journal › Article › peer-review

  Open Access

  • fluorescent protein 583
  • licochalcone A
  • Alzheimer Disease
  • Neuronal Outgrowth
  • Reactive Oxygen Species
  2 Citations (Scopus)

• Lactulose and Melibiose Attenuate MPTP-Induced Parkinson’s Disease in Mice by Inhibition of Oxidative Stress, Reduction of Neuroinflammation and Up-Regulation of Autophagy

  Lin, C. H., Wei, P. C., Chen, C. M., Huang, Y. T., Lin, J. L., Lo, Y. S., Lin, J. L., Lin, C. Y., Wu, Y. R., Chang, K. H. & Lee-Chen, G. J., 2020 Jul 24, In: Frontiers in Aging Neuroscience. 12, 226.

  Research output: Contribution to journal › Article › peer-review

  Open Access

  • Melibiose
  • Lactulose
  • 1-Methyl-4-phenyl-1,2,3,6-tetrahydropyridine
  • Autophagy
  • Parkinson Disease

• Lactulose and Melibiose Inhibit α-Synuclein Aggregation and Up-Regulate Autophagy to Reduce Neuronal Vulnerability

  Chen, C. M., Lin, C. H., Wu, Y. R., Yen, C. Y., Huang, Y. T., Lin, J. L., Lin, C. Y., Chen, W. L., Chao, C. Y., Lee-Chen, G. J., Su, M. T. & Chang, K. H., 2020 May 16, In: Cells. 9, 5

  Research output: Contribution to journal › Article › peer-review

  Open Access

  • Melibiose
  • Synucleins
  • Lactulose
  • Autophagy
  • Up-Regulation
  2 Citations (Scopus)

• Neural Correlates of Repetition Priming: A Coordinate-Based Meta-Analysis of fMRI Studies

  Lee, S. M., Henson, R. N. & Lin, C. Y., 2020 Sep 18, In: Frontiers in Human Neuroscience. 14, 565114.

  Research output: Contribution to journal › Review article › peer-review

  Open Access

  • Repetition Priming
  • Meta-Analysis
  • Magnetic Resonance Imaging
  • Brain
  • Temporal Lobe
• 2019

  ESD Protection Design for Open-Drain Power Amplifier in CMOS Technology

  Lin, C. Y. & Li, G. Y., 2019 Dec, In: IEEE Transactions on Device and Materials Reliability. 19, 4, p. 782-790 9 p., 8892659.

  Research output: Contribution to journal › Article › peer-review

  • Electrostatic discharge
  • Power amplifiers
  • Diodes
  • Thyristors
  • Radio frequency amplifiers

• Microbubble-facilitated ultrasound pulsation promotes direct α-synuclein gene delivery

  Lin, C. J., Lin, C. Y., Lin, Y. T., Huang, C. Y., Wei, K. C., Chen, J. C., Lee-Chen, G. J. & Liu, H. L., 2019 Sep 10, In: Biochemical and Biophysical Research Communications. 517, 1, p. 77-83 7 p.

  Research output: Contribution to journal › Article › peer-review

  • Synucleins
  • Microbubbles
  • Genes
  • Ultrasonics
  • Brain

• Orbitofrontal dysfunction during the reward process in adults with ADHD: An fMRI study

  Yang, D. Y., Chi, M. H., Chu, C. L., Lin, C. Y., Hsu, S. E., Chen, K. C., Lee, I. H., Chen, P. S. & Yang, Y. K., 2019 May, In: Clinical Neurophysiology. 130, 5, p. 627-633 7 p.

  Research output: Contribution to journal › Article › peer-review

  • Attention Deficit Disorder with Hyperactivity
  • Reward
  • Gambling
  • Magnetic Resonance Imaging
  • Prefrontal Cortex
  4 Citations (Scopus)

• π-SCR Device for Broadband ESD Protection in Low-Voltage CMOS Technology

  Lin, C. Y. & Lai, Y. H., 2019 Sep, In: IEEE Transactions on Electron Devices. 66, 9, p. 4107-4110 4 p., 8764565.

  Research output: Contribution to journal › Article › peer-review

  • Electrostatic discharge
  • Thyristors
  • Electric potential
  • Diodes
  • Silicon
  1 Citation (Scopus)
• 2018

  ESD Protection Design with Low-Leakage Consideration for Silicon Chips of IoT Applications

  Ker, M. D., Lin, C. Y., Wu, Y. H. & Wang, W. T., 2018 Aug 24, 2017 IEEE 7th Annual International Conference on CYBER Technology in Automation, Control, and Intelligent Systems, CYBER 2017. Institute of Electrical and Electronics Engineers Inc., p. 1496-1499 4 p. 8446566. (2017 IEEE 7th Annual International Conference on CYBER Technology in Automation, Control, and Intelligent Systems, CYBER 2017).

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • Silicon
  • Leakage
  • Electrostatic discharge
  • Chip
  • Electrostatics
  1 Citation (Scopus)

• High-voltage driving circuit with on-chip ESD protection in CMOS technology

  Lin, C. Y. & Chiu, Y. L., 2018 Feb 2, ICIIBMS 2017 - 2nd International Conference on Intelligent Informatics and Biomedical Sciences. Institute of Electrical and Electronics Engineers Inc., p. 223-224 2 p. (ICIIBMS 2017 - 2nd International Conference on Intelligent Informatics and Biomedical Sciences; vol. 2018-January).

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • Electrostatic discharge
  • Chip
  • Electrostatics
  • Voltage
  • Networks (circuits)
  1 Citation (Scopus)

• Improved ESD Protection Design for High-Frequency Applications in CMOS Technology

  Lin, M. T. & Lin, C. Y., 2018 Oct 25, 2018 43rd International Conference on Infrared Millimeter and Terahertz Waves, IRMMW-THz 2018. IEEE Computer Society, 8509852. (International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz; vol. 2018-September).

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • Electrostatic discharge
  • Clamping devices
  • Thyristors
  • Diodes
  • Integrated circuits

• Investigation and application of vertical NPN devices for RF ESD protection in BiCMOS technology

  Huang, G. L., Fu, W. H. & Lin, C. Y., 2018 Apr, In: Microelectronics Reliability. 83, p. 271-280 10 p.

  Research output: Contribution to journal › Article › peer-review

  • Electrostatic discharge
  • BiCMOS technology
  • radio frequencies
  • electrostatics
  • integrated circuits

• Low-C ESD protection design with dual resistor-triggered SCRs in CMOS technology

  Lin, C. Y. & Chen, C. Y., 2018 Jun 1, In: IEEE Transactions on Device and Materials Reliability. 18, 2, p. 197-204 8 p.

  Research output: Contribution to journal › Article › peer-review

  • Electrostatic discharge
  • Thyristors
  • Resistors
  • Capacitance
  • Diodes
  1 Citation (Scopus)

• Low-Loss I/O Pad with ESD Protection for K/Ka-Bands Applications in the Nanoscale CMOS Process

  Peng, B. W. & Lin, C. Y., 2018 Oct 1, In: IEEE Transactions on Circuits and Systems II: Express Briefs. 65, 10, p. 1475-1479 5 p., 8412600.

  Research output: Contribution to journal › Article › peer-review

  • Electrostatic discharge
  • Diodes
  • Integrated circuits
  • Capacitance
  • Silicon

• On-Chip HBM and HMM ESD Protection Design for RF Applications in 40-nm CMOS Process

  Chen, J. T., Lin, C. Y., Chang, R. K. & Ker, M. D., 2018 Dec 1, In: IEEE Transactions on Electron Devices. 65, 12, p. 5267-5274 8 p., 8501596.

  Research output: Contribution to journal › Article › peer-review

  • Electrostatic discharge
  • Networks (circuits)
  • Thyristors
  • Diodes
  • Metals
  5 Citations (Scopus)
• 2017

  Design of 2.4-GHz T/R switch with embedded ESD protection devices in CMOS process

  Lin, C. Y., Liu, R. H. & Ker, M. D., 2017 Nov, In: Microelectronics Reliability. 78, p. 258-266 9 p.

  Research output: Contribution to journal › Article › peer-review

  • Electrostatic discharge
  • CMOS
  • switches
  • electrostatics
  • Switches

• ESD protection design for high-speed circuits in nanoscale CMOS process

  Lin, C. Y. & Chang, R. K., 2017 Jan 23, 2016 International Symposium on Integrated Circuits, ISIC 2016. Institute of Electrical and Electronics Engineers Inc., 7829726. (2016 International Symposium on Integrated Circuits, ISIC 2016).

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • Electrostatic discharge
  • Networks (circuits)
  • Thyristors
  • Diodes
  • Integrated circuits

• Improved stacked-diode ESD protection in nanoscale CMOS technology

  Lin, C. Y. & Lin, M. T., 2017, In: IEICE Electronics Express. 14, 13, 20170570.

  Research output: Contribution to journal › Article › peer-review

  • Electrostatic discharge
  • Diodes
  • silicon controlled rectifiers
  • CMOS
  • electrostatics
  4 Citations (Scopus)

• K-band low-noise amplifier with stacked-diode esd protection in nanoscale CMOS technology

  Lin, M. T. & Lin, C. Y., 2017 Oct 5, 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2017. Institute of Electrical and Electronics Engineers Inc., p. 1-4 4 p. (Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA; vol. 2017-July).

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • Electrostatic discharge
  • Low noise amplifiers
  • Diodes
  • Clamping devices
  • Thyristors
  2 Citations (Scopus)

• Monolithic Multi-Sensor Design with Resonator-Based MEMS Structures

  Kuo, F. Y., Lin, C. Y., Chuang, P. C., Chien, C. L., Yeh, Y. L. & Wen, S. K. A., 2017 May, In: IEEE Journal of the Electron Devices Society. 5, 3, p. 214-218 5 p., 7851031.

  Research output: Contribution to journal › Article › peer-review

  Open Access

  • Micro-Electrical-Mechanical Systems
  • Resonators
  • MEMS
  • Sensors
  • Application specific integrated circuits
  5 Citations (Scopus)

• On-chip ESD protection design for radio-frequency power amplifier with large-swing-tolerance consideration

  Li, G. Y. & Lin, C. Y., 2017 Jan 3, 2016 IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2016. Institute of Electrical and Electronics Engineers Inc., p. 258-261 4 p. 7803948. (2016 IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2016).

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • Radio frequency amplifiers
  • Electrostatic discharge
  • Power amplifiers
  • Thyristors
  • Diodes
  2 Citations (Scopus)

• On-Chip ESD Protection Device for High-Speed I/O Applications in CMOS Technology

  Chen, J. T., Lin, C. Y. & Ker, M. D., 2017 Oct 1, In: IEEE Transactions on Electron Devices. 64, 10, p. 3979-3985 7 p., 8008837.

  Research output: Contribution to journal › Article › peer-review

  • Electrostatic discharge
  • Diodes
  • Capacitance
  • Thyristors
  • Networks (circuits)
  14 Citations (Scopus)

• Resistor-triggered SCR device for ESD protection in high-speed I/O interface circuits

  Lin, C-Y., Chen, C. Y. & Tabib-Azar, M., 2017 Jun 1, In: IEEE Electron Device Letters. 38, 6, p. 712-715 4 p., 7907283.

  Research output: Contribution to journal › Article › peer-review

  • Electrostatic discharge
  • Thyristors
  • Resistors
  • Networks (circuits)
  • Electric potential
  7 Citations (Scopus)
• 2016

  Area-efficient and low-leakage diode string for On-Chip ESD protection

  Lin, C. Y., Wu, P. H. & Ker, M. D., 2016 Feb 1, In: IEEE Transactions on Electron Devices. 63, 2, p. 531-536 6 p., 7353163.

  Research output: Contribution to journal › Article › peer-review

  • Electrostatic discharge
  • Diodes
  • Leakage currents
  • Silicides
  • Silicon
  19 Citations (Scopus)

• Design of embedded SCR device to improve ESD robustness of stacked-device output driver in low-voltage CMOS technology

  Lin, C. Y. & Chiu, Y. L., 2016 Oct 1, In: Solid-State Electronics. 124, p. 28-34 7 p.

  Research output: Contribution to journal › Article › peer-review

  • silicon controlled rectifiers
  • Electrostatic discharge
  • Thyristors
  • low voltage
  • CMOS
  4 Citations (Scopus)

• Design of local ESD clamp for cross-power-domain interface circuits

  Lin, C. Y., Chiu, Y. K. & Yueh, S. Y., 2016, In: IEICE Electronics Express. 13, 20, 20160806.

  Research output: Contribution to journal › Article › peer-review

  • Electrostatic discharge
  • clamps
  • Clamping devices
  • electrostatics
  • Networks (circuits)

• Diode string with reduced clamping voltage for efficient on-chip ESD protection

  Lin, C. Y. & Fu, W. H., 2016 Dec, In: IEEE Transactions on Device and Materials Reliability. 16, 4, p. 688-690 3 p., 7588053.

  Research output: Contribution to journal › Article › peer-review

  • Electrostatic discharge
  • Diodes
  • Electric potential
  • Oxide semiconductors
  • Metals
  1 Citation (Scopus)

• ESD protection design for high-speed applications in CMOS technology

  Chen, J. T., Lin, C. Y., Chang, R. K., Ker, M. D., Tzeng, T. C. & Lin, T. C., 2016 Jul 2, 2016 IEEE 59th International Midwest Symposium on Circuits and Systems, MWSCAS 2016. Institute of Electrical and Electronics Engineers Inc., 7870016. (Midwest Symposium on Circuits and Systems; vol. 0).

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • Electrostatic discharge
  • Capacitance
  • Silicon
  • Diodes
  3 Citations (Scopus)

• ESD self-protection design on 2.4-GHz T/R switch for RF application in CMOS process

  Lin, C. Y., Liu, R. H. & Ker, M. D., 2016 Sep 22, 2016 International Reliability Physics Symposium, IRPS 2016. Institute of Electrical and Electronics Engineers Inc., p. EL11-EL14 7574602. (IEEE International Reliability Physics Symposium Proceedings; vol. 2016-September).

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • Transceivers
  • Switches
  3 Citations (Scopus)

• Low-Leakage and Low-Trigger-Voltage SCR Device for ESD Protection in 28-nm High-k Metal Gate CMOS Process

  Lin, C. Y., Wu, Y. H. & Ker, M. D., 2016 Nov, In: IEEE Electron Device Letters. 37, 11, p. 1387-1390 4 p.

  Research output: Contribution to journal › Article › peer-review

  • Electrostatic discharge
  • Thyristors
  • Metals
  • Electric potential
  • Leakage currents
  14 Citations (Scopus)

• Study on the ESD-induced gate-oxide breakdown and the protection solution in 28nm high-k metal-gate CMOS technology

  Lin, C. Y., Ker, M. D., Chang, P. H. & Wang, W. T., 2016 Mar 22, 2015 IEEE Nanotechnology Materials and Devices Conference, NMDC 2015. Institute of Electrical and Electronics Engineers Inc., 7439250. (2015 IEEE Nanotechnology Materials and Devices Conference, NMDC 2015).

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • Electrostatic discharge
  • Oxides
  • Metals
  • Thyristors
  7 Citations (Scopus)

• Test structures of LASCR device for RF ESD protection in nanoscale CMOS process

  Lin, C-Y. & Chang, R. K., 2016 May 20, 2016 29th IEEE International Conference on Microelectronic Test Structures, ICMTS 2016 - Conference Proceedings. Institute of Electrical and Electronics Engineers Inc., p. 100-103 4 p. 7476183. (IEEE International Conference on Microelectronic Test Structures; vol. 2016-May).

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • Electrostatic discharge
  • Thyristors
  • Integrated circuits
  • Silicon
  1 Citation (Scopus)
• 2015

  Design of ESD Protection Device for K/Ka-Band Applications in Nanoscale CMOS Process

  Lin, C. Y. & Chang, R. K., 2015 Sep 1, In: IEEE Transactions on Electron Devices. 62, 9, p. 2824-2829 6 p., 7163314.

  Research output: Contribution to journal › Article › peer-review

  • Electrostatic discharge
  • Silicon
  • Thyristors
  12 Citations (Scopus)

• ESD protection design for gigahertz differential LNA in a 65-nm CMOS process

  Lin, C-Y., Fan, M. L. & Fu, W. H., 2015 Aug 3, 2015 Asia-Pacific International Symposium on Electromagnetic Compatibility, APEMC 2015. Institute of Electrical and Electronics Engineers Inc., p. 322-324 3 p. 7175245

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • Differential amplifiers
  • Electrostatic discharge
  • Low noise amplifiers
  • low noise
  • CMOS

• Impact of Inner Pickup on ESD Robustness of Multifinger MOSFET in 28-nm High-k/Metal Gate CMOS Process

  Lin, C-Y., Chang, P. H. & Chang, R. K., 2015 Dec 1, In: IEEE Transactions on Device and Materials Reliability. 15, 4, p. 633-636 4 p., 7312970.

  Research output: Contribution to journal › Article › peer-review

  • Electrostatic discharge
  • Pickups
  • Metals
  • Silicon
  3 Citations (Scopus)

• Improving ESD Robustness of pMOS Device With Embedded SCR in 28-nm High-k/Metal Gate CMOS Process

  Lin, C. Y., Chang, P. H. & Chang, R. K., 2015 Apr 1, In: IEEE Transactions on Electron Devices. 62, 4, p. 1349-1352 4 p., 7038138.

  Research output: Contribution to journal › Article › peer-review

  • Electrostatic discharge
  • Thyristors
  • Metals
  • Capacitance
  • Electric potential
  9 Citations (Scopus)

• Investigation on SCR-based ESD protection device for biomedical integrated circuits in a 0.18-μm CMOS process

  Lin, C. Y. & Chiu, Y. L., 2015 Jan 1, In: Microelectronics Reliability. 55, 11, p. 2229-2235 7 p.

  Research output: Contribution to journal › Article › peer-review

  • silicon controlled rectifiers
  • Electrostatic discharge
  • Thyristors
  • integrated circuits
  • Integrated circuits
  1 Citation (Scopus)

• Vertical SCR structure for on-chip ESD protection in nanoscale CMOS technology

  Lin, C-Y., Chang, P. H., Chang, R. K., Ker, M. D. & Wang, W. T., 2015 Aug 25, Proceedings of the 22nd International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2015. Institute of Electrical and Electronics Engineers Inc., p. 255-258 4 p. 7224380. (Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA; vol. 2015-August).

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • Thyristors
  • Electric potential
  2 Citations (Scopus)
• 2014

  A fully integrated 8-channel closed-loop neural-prosthetic cmos soc for real-time epileptic seizure control

  Chen, W. M., Chiueh, H., Chen, T. J., Ho, C. L., Jeng, C., Ker, M. D., Lin, C-Y., Huang, Y. C., Chou, C. W., Fan, T. Y., Cheng, M. S., Hsin, Y. L., Liang, S. F., Wang, Y. L., Shaw, F. Z., Huang, Y. H., Yang, C. H. & Wu, C. Y., 2014 Jan 1, In: IEEE Journal of Solid-State Circuits. 49, 1, p. 232-247 16 p., 6637111.

  Research output: Contribution to journal › Article › peer-review

  • Prosthetics
  • System-on-chip
  • Amplitude shift keying
  • Rats
  • Cutoff frequency
  128 Citations (Scopus)

• A high-voltage-tolerant stimulator realized in the low-voltage CMOS process for cochlear implant

  Lin, K. Y., Ker, M. D. & Lin, C. Y., 2014, 2014 IEEE International Symposium on Circuits and Systems, ISCAS 2014. Institute of Electrical and Electronics Engineers Inc., p. 237-240 4 p. 6865109. (Proceedings - IEEE International Symposium on Circuits and Systems).

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • Cochlear implants
  • Electric potential
  • Networks (circuits)
  • System-on-chip
  • Oxides
  1 Citation (Scopus)

• Design of ESD protection diodes with embedded scr for differential LNA in a 65-nm CMOS Process

  Lin, C. Y. & Fan, M. L., 2014 Nov 1, In: IEEE Transactions on Microwave Theory and Techniques. 62, 11, p. 2723-2732 10 p., 6906306.

  Research output: Contribution to journal › Article › peer-review

  • Differential amplifiers
  • Electrostatic discharge
  • Low noise amplifiers
  • low noise
  • Diodes
  12 Citations (Scopus)

• Design of high-voltage-tolerant stimulus driver with adaptive loading consideration to suppress epileptic seizure in a 0.18-μm CMOS process

  Lin, C. Y., Li, Y. J. & Ker, M. D., 2014 May, In: Analog Integrated Circuits and Signal Processing. 79, 2, p. 219-226 8 p.

  Research output: Contribution to journal › Article › peer-review

  • Electric potential
  • Transistors
  • Prosthetics
  • System-on-chip
  • Acoustic impedance
  5 Citations (Scopus)

• ESD protection design for wideband RF applications in 65-nm CMOS process

  Chu, L. W., Lin, C. Y., Ker, M. D., Song, M. H., Tseng, J. C., Jou, C. P. & Tsai, M. H., 2014, 2014 IEEE International Symposium on Circuits and Systems, ISCAS 2014. Institute of Electrical and Electronics Engineers Inc., p. 1480-1483 4 p. 6865426. (Proceedings - IEEE International Symposium on Circuits and Systems).

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • Electrostatic discharge
  • Networks (circuits)
  • Diodes
  • Capacitance
  • Tuning
  1 Citation (Scopus)

• Improving ESD robustness of stacked diodes with embedded SCR for RF applications in 65-nm CMOS

  Lin, C-Y., Fan, M. L., Ker, M. D., Chu, L. W., Tseng, J. C. & Song, M. H., 2014 Jan 1, 2014 IEEE International Reliability Physics Symposium, IRPS 2014. Institute of Electrical and Electronics Engineers Inc., 6861132

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • Electrostatic discharge
  • Thyristors
  • Diodes
  • Integrated circuits
  • Capacitance
  9 Citations (Scopus)

• Optimization on layout style of diode stackup for on-chip ESD protection

  Lin, C. Y. & Fan, M. L., 2014 Jun, In: IEEE Transactions on Device and Materials Reliability. 14, 2, p. 775-777 3 p., 6763105.

  Research output: Contribution to journal › Article › peer-review

  • Electrostatic discharge
  • Diodes
  • Capacitance
  7 Citations (Scopus)

• The negative attribution processes of mothers of children with attention deficit/hyperactivity disorder

  Huang, H. L., Li, S. S., Cheng, C. P., Lin, C. Y., Yang, Y. K. & Huang, J. H., 2014 Jan 1, In: Research in Developmental Disabilities. 35, 1, p. 87-98 12 p.

  Research output: Contribution to journal › Article › peer-review

  • Attention Deficit Disorder with Hyperactivity
  • Mothers
  • Child Behavior
  • Child
  • Impulsive Behavior
  1 Citation (Scopus)