Engineering
Data Retention
66%
Design of Experiments
33%
Device Performance
33%
Dopants
100%
Early Work
33%
Flash Memory
66%
Floating Gate
33%
Gate Stack
100%
Interface Trap
33%
Material System
33%
Nonvolatile Memory
100%
Plasma Treatment
33%
Polysilicon
33%
Reliability Availability and Maintainability (Reliability Engineering)
100%
Reliability Issue
33%
Resistive
33%
Switching State
33%
INIS
applications
25%
budgets
12%
carriers
12%
charges
25%
compatibility
12%
conferences
12%
data
25%
defects
50%
density
12%
design
12%
devices
50%
doped materials
50%
energy
25%
ferroelectric materials
100%
films
25%
fluorine
12%
interfaces
12%
leakage current
12%
memory devices
25%
nitrogen
12%
performance
12%
plasma
12%
polarization
12%
power
12%
reliability
25%
retention
25%
scaling
25%
size
12%
solutions
12%
speed
12%
stacks
37%
thickness
12%
transistors
62%
trapping
25%
traps
12%
volatility
25%
Material Science
Charge Trapping
25%
Density
12%
Doping (Additives)
37%
Ferroelectric Material
100%
Ferroelectricity
12%
Film
25%
Nanodevice
12%
Transistor
62%