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Fingerprint Fingerprint is based on mining the text of the person's scientific documents to create an index of weighted terms, which defines the key subjects of each individual researcher.

  • 2 Similar Profiles
Atoms Engineering & Materials Science
atoms Physics & Astronomy
adatoms Physics & Astronomy
Adatoms Engineering & Materials Science
Annealing Engineering & Materials Science
Epitaxial growth Engineering & Materials Science
Ion microscopes Engineering & Materials Science
Scanning tunneling microscopy Chemical Compounds

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Research Output 1994 2018

1 Citation (Scopus)

Single crystalline silicene consist of various superstructures using a flexible ultrathin Ag(111) template on Si(111)

Hsu, H. C., Lu, Y. H., Su, T. L., Lin, W. C. & Fu, T. Y., 2018 May 30, In : Semiconductor Science and Technology. 33, 7, 075004.

Research output: Contribution to journalArticle

templates
Single crystals
Crystalline materials
single crystals
Defects
4 Citations (Scopus)

Xenon gas field ion source from a single-atom tip

Lai, W. C., Lin, C. Y., Chang, W. T., Li, P. C., Fu, T. Y., Chang, C. S., Tsong, T. T. & Hwang, I. S., 2017 May 26, In : Nanotechnology. 28, 25, 255301.

Research output: Contribution to journalArticle

Oil and Gas Fields
Xenon
Ion sources
Gases
Ions
1 Citation (Scopus)

A nanoemitter based on a superconducting material

Hou, J. L., Chang, W. T., Shih, C. C., Yu, Y. F., Fu, T. Y. & Hwang, I. S., 2016 Jun 27, In : Applied Physics Letters. 108, 26, 263107.

Research output: Contribution to journalArticle

An electron source possessing spatial and temporal coherence: A niobium nanoemitter

Chang, W. T., Hou, J. L., Shih, C. C., Yu, Y. F., Fu, T-Y. & Hwang, I. S., 2016 Aug 24, 2016 29th International Vacuum Nanoelectronics Conference, IVNC 2016. Institute of Electrical and Electronics Engineers Inc., 7551476. (2016 29th International Vacuum Nanoelectronics Conference, IVNC 2016).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Niobium
Electron sources
electron sources
niobium
flat surfaces

Direct view of silicon initial growth on metal surfaces

Fu, T-Y., Chen, Y. C., Liang, G. C., Wang, C. Y. & Lin, R. J., 2016 Nov 1, In : Thin Solid Films. 618, p. 81-83 3 p.

Research output: Contribution to journalArticle

Silicon
metal surfaces
Metals
flat surfaces
Graphite