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Chun-Yu Lin

 https://orcid.org/0000-0003-3375-520X
  • 552 Citations
  • 11 h-Index
20072018
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Fingerprint Dive into the research topics where Chun-Yu Lin is active. These topic labels come from the works of this person. Together they form a unique fingerprint.

  • 3 Similar Profiles
Electrostatic discharge Engineering & Materials Science
Thyristors Engineering & Materials Science
Networks (circuits) Engineering & Materials Science
electrostatics Physics & Astronomy
Capacitance Engineering & Materials Science
CMOS Physics & Astronomy
Diodes Engineering & Materials Science
Integrated circuits Engineering & Materials Science

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Research Output 2007 2018

1 Citation (Scopus)

ESD Protection Design with Low-Leakage Consideration for Silicon Chips of IoT Applications

Ker, M. D., Lin, C. Y., Wu, Y. H. & Wang, W. T., 2018 Aug 24, 2017 IEEE 7th Annual International Conference on CYBER Technology in Automation, Control, and Intelligent Systems, CYBER 2017. Institute of Electrical and Electronics Engineers Inc., p. 1496-1499 4 p. 8446566. (2017 IEEE 7th Annual International Conference on CYBER Technology in Automation, Control, and Intelligent Systems, CYBER 2017).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Electrostatic discharge
Leakage
Electrostatics
Silicon
Chip

High-voltage driving circuit with on-chip ESD protection in CMOS technology

Lin, C. Y. & Chiu, Y. L., 2018 Feb 2, ICIIBMS 2017 - 2nd International Conference on Intelligent Informatics and Biomedical Sciences. Institute of Electrical and Electronics Engineers Inc., p. 223-224 2 p. (ICIIBMS 2017 - 2nd International Conference on Intelligent Informatics and Biomedical Sciences; vol. 2018-January).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Electrostatic discharge
Electrostatics
Chip
Voltage
Networks (circuits)

Improved ESD Protection Design for High-Frequency Applications in CMOS Technology

Lin, M. T. & Lin, C. Y., 2018 Oct 25, 2018 43rd International Conference on Infrared Millimeter and Terahertz Waves, IRMMW-THz 2018. IEEE Computer Society, 8509852. (International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz; vol. 2018-September).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Electrostatic discharge
Clamping devices
Thyristors
Integrated circuits
Rails

Investigation and application of vertical NPN devices for RF ESD protection in BiCMOS technology

Huang, G. L., Fu, W. H. & Lin, C-Y., 2018 Apr 1, In : Microelectronics Reliability. 83, p. 271-280 10 p.

Research output: Contribution to journal › Article

BiCMOS technology
Electrostatic discharge
radio frequencies
electrostatics
integrated circuits
1 Citation (Scopus)

Low-C ESD protection design with dual resistor-triggered SCRs in CMOS technology

Lin, C. Y. & Chen, C. Y., 2018 Jun 1, In : IEEE Transactions on Device and Materials Reliability. 18, 2, p. 197-204 8 p.

Research output: Contribution to journal › Article

Electrostatic discharge
Thyristors
Resistors
Capacitance
Diodes