• 575 Citations
  • 13 h-Index
19972019

Research output per year

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Research Output

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Conference article
2012

Adaptive Fuzzy Cerebellar Model Articulation Controller for two-wheeled robot

Chen, J. Y., Lin, K. C., Tsai, P. S., Liu, C-H. & Ouyang, J. M., 2012 Apr 4, In : Advanced Materials Research. 482-484, p. 1025-1036 12 p.

Research output: Contribution to journalConference article

2002

Extending the reliability scaling limit of gate dielectrics through remote plasma nitridation of N2O-grown oxides and NO RTA treatment

Liu, C. H., Lin, H. S., Lin, Y. Y., Chen, M. G., Pan, T. M., Kao, C. J., Huang, K. T., Lin, S. H., Sheng, Y. C., Chang, W. T., Lee, J. H., Huang, M., Hsiung, C. S., Huang-Lu, S., Hsu, C. C., Liang, A. Y., Chen, J., Hsieh, W. Y., Yen, P. W., Chien, S. C. & 3 others, Loh, Y. T., Chang, Y. J. & Liou, F. T., 2002 Jan 1, In : Annual Proceedings - Reliability Physics (Symposium). p. 268-271 4 p.

Research output: Contribution to journalConference article

2 Citations (Scopus)
2000

Comparison and correlation of ESD HBM (Human Body Model) obtained between TLPG, wafer-level, and package-level tests

Lee, M. T., Liu, C. H., Lin, C. C., Chou, J. T., Tang, H. T. H., Chang, Y. J. & Fu, K. Y., 2000 Dec 1, In : Electrical Overstress/Electrostatic Discharge Symposium Proceedings. p. 105-110 6 p.

Research output: Contribution to journalConference article

2 Citations (Scopus)
1999

Analysis of hot-carrier degradation in 0.25-μm surface-channel pMOSFET devices

Liu, C. H., Chen, M. G., Huang-Lu, S., Chang, Y. J. & Fu, K. Y., 1999 Jan 1, In : International Symposium on VLSI Technology, Systems, and Applications, Proceedings. p. 82-85 4 p.

Research output: Contribution to journalConference article

4 Citations (Scopus)

Modeling and correlation of gate oxide QBD between exponential current ramp and constant current stresses

Liu, C-H., Cheng, T. J., Wang, M. C., Yang, S. H. & Fu, K. Y., 1999 Jan 1, In : International Symposium on VLSI Technology, Systems, and Applications, Proceedings. p. 94-95 2 p.

Research output: Contribution to journalConference article

1 Citation (Scopus)
1997

Breakdown model and lifetime projection for thin gate oxide MOS devices

Liu, C-H., Grondin, R. O., DeMassa, T. A. & Sanchez, J. J., 1997 Dec 1, In : Biennial University/Government/Industry Microelectronics Symposium - Proceedings. p. 78-82 5 p.

Research output: Contribution to journalConference article